Synchrotron X-radiation

Caffrey, M. Structural, Mesomorphic and Time-Resolved Studies of Biological Liquid Crystals and Lipid Membranes Using Synchrotron X-Radiation. 151, 75-109 (1989). 

In order to obtain detailed structure, a knowledge of diffraction intensities is essential, the intensities being related to the structure factor. Computer-controlled single-crystal X-ray diffractometers with structure (software) packages have made structure elucidation a routine matter. The availability of synchrotron X-radiation of continuously variable wavelength has made X-ray diffraction a still more powerful structural tool for the study of solids. A technique of great utility to solid state chemists is the Rietveld treatment of powder X-ray diffraction profiles (Rietveld, 1969 Manohar, 1983). Automated structure packages for the determination of unknown structures by this method are now commercially available (see section 2.2.3). In Fig. 2.1, we show a typical set of profile data. 

Burton DJ,Lu L (1997) Fluorinated Organometallic Compounds. 193 45 - 89 Caffrey M (1989) Structural, Mesomorphic and Time-Resolved Studies of Biological Liquid Crystals and Lipid Membranes Using Synchrotron X-Radiation. 151 75 -109 Canceill J, see Collet A (1993) 165 103 -129 Carbd R, see Besalu E (1995) 173 31-62... 

In the present report we describe initial syntheses in the M20-Si02-Sn02 H20 system. We illustrate how developments in characterization techniques can facilitate the identification of new phases in these types of systems. We mention use of synchrotron X-radiation in microcrystal diffraction experiments, full profile fitting of in-house powder X-ray diffraction data, and infrared and solid state 129Sn and 29Si nmr spectroscopies. 

Caffrey M. Structural, mesomorphic and time-resolved studies of biological liquid-crystals and lipid-membranes using synchrotron x-radiation. Top. Curr. Chem. 1989 151 75-109. 

Greenhough, T. J., Helliwell, J. R., and Rule, S. A. Oscillation camera data processing. 3. General diffraction spot size, shape and energy profile formalism for polychromatic diffraction experiments with monochromatized synchrotron X-radiation from a singly bent triangular monochromator. J. Appl. Cryst. 16, 242-250 (1983). 

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