Surface spectroscopy, sample preparation trace analysis

ATR accessory can also be employed for reflectance analysis, particularly for the surfaces of smears sticking on a given support with, e.g., SplitPea accessory (Flarrick Scientific Corporation) very small paint traces can be measured (<0.3 mm) without sample preparation, on the basis of internal reflection, external reflection, or in-line diffuse reflection spectroscopy. 

Electrocatalytic reactions occur on catalyst surfaces. The catalyst surface structure and chemically bonded or physically absorbed substances on the catalyst surface exert strong influences on catalyst activity and efficiency. X-ray photoelectron spectroscopy (XPS) (also known as electron spectroscopy for chemical analysis (ESCA), auger emission spectroscopy (AES), or auger analysis) is a failure analysis technique used to identify elements present on the surface of the sample. For instance, this can be used to identify Pt and carbon surface chemical species that may present histories of chemical reactions or contamination in the catalyst layer. AES and XPS can also provide depth profiles of element analysis. Wang et al. [41] studied XPS spectra of carbon and Pt before and after fuel cell operation. They observed a significant increase in O Is peak value for each oxidized carbon support, the result of a higher surface oxide content in the support surface due to electrochemical oxidation. However, sample preparation in AES and XPS analysis is critical because these methods are very sensitive to a trace amount of contaminants on sample surfaces, and detect as little as 2-10 atoms on the sample surface. 

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