SPM method

SNOM combines the optical contrast with a high lateral resolution of SPMs [55,56]. Scanning a surface with a sharp optical fibre tip within the range of the optical near field makes it possible to overcome the optical diffraction limit that restricts the resolution of conventional optical microscopy. Moreover, the SNOM probe operates at a finite distance from the surface, so that damage and distortion of delicate samples can be eliminated. The drawback of SNOM compared to other SPM methods is its relatively low resolution - around tens of nanometers [62,63]. 

PMMA-POSS15 cyclopentyl-POSS) as compatibilizer, using scanning transmission X-ray microscopy (STXM) and scanning probe microscopy (SPM) methods was examined. 

This paper presents investigations of the nanocomposite films by different SPM methods featuring a powerful instrument for micron-to-nanometer-scale... 

Multivariate SPM methods with PCs can employ various types of monitoring charts. If only a few PCs can describe the process behavior in a satisfactory manner, biplots could be used as visual aids that are easy to interpret. Such biplots can be generated by projecting the data to two dimensional surfaces as PC versus PC2, PC versus SPE, and PC2-SPE as illustrated in Figure 5.1. 

Since yMst is a random variable, SPM tools can be used to detect statistically significant changes. histXk) is highly autocorrelated. Use of traditional SPM charts for autocorrelated variables may yield erroneous results. An alternative SPM method for autocorrelated data is based on the development of a time series model, generation of the residuals between the values predicted by the model and the measured values, and monitoring of the residuals [1]. The residuals should be approximately normally and independently distributed with zero-mean and constant-variance if the time series model provides an accurate description of process behavior. Therefore, popular univariate SPM charts (such as x-chart, CUSUM, and EWMA charts) are applicable to the residuals. Residuals-based SPM is used to monitor lhist k). An AR model is used for representing st k) ... 

MULTIMODE SPM METHODS FOR NANOMETER RESOLUTION STUDY OF LANGMUIR-BLODGETT FILMS... 

In conclusion, the investigations carried out on the LB films by SPM methods have demonstrated high mobility of the LB films with a tendency for restructuring mainly in the process of formation. The LB film surface morphology changes drastically with varying number of monolayers, subphase and the type of substrate used. 

Note Values in SPM method have been multiplied by 2.0 to transfer from surf zone mid-depth to still water line. 

Although not a scanning probe microscopy at the atomic level, scanning Kelvin microscopy shows some (macroscopic) similarities to SPM methods. At variance to STM, SKM measurements are performed with a tip operating in the far-held ptm Vi. nm scale). 

The invention of scanning tunneling microscopy (STM) about three decades ago [1,2] opened a new age in which various related scanning probe microscopy (SPM) methods were developed and some of those were widely accepted as key tools for nanotechnology. Although the original STM limited its application to conductive materials, atomic force microscopy (AFM), which appeared soon after the invention of STM [3], proved applicable to various types of materials, including polymeric materials. 

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