SIMS application fields

Modem TOF-SIMS applications are often in the field of synthetic polymer analysis, but rarely for the determination of molecular weight distributions which is the domain of MALDI. More frequently, low-molecular-weight additives or surface modifications are analyzed as there is no interference with a matrix as would... 

Stylus profilometry represents by far the most heavily used of all the methods used to derive sputter rates, irrespective of the application field in SIMS. This is primarily due to its simplicity, cost effectiveness, and the speed in which accurate and precise data can be attained. 

An important though deman ding book. Topics include statistical mechanics, Monte Carlo sim illation s. et uilibrium and non -ec iiilibrium molecular dynamics, an aly sis of calculation al results, and applications of methods to problems in liquid dynamics. The authors also discuss and compare many algorithms used in force field simulations. Includes a microfiche containing dozens of Fortran-77 subroutines relevant to molecular dynamics and liquid simulations. 

The basic instrumental set-up for dynamic SIMS is the same as for SSIMS (Sect. 3.1.2). Depending on the intensity, beam diameter, and ion species needed, dif ferent ion sources are used. Several mass analyzers with different characteristics enable a broad field of applications. 

Surface analysis has made enormous contributions to the field of adhesion science. It enabled investigators to probe fundamental aspects of adhesion such as the composition of anodic oxides on metals, the surface composition of polymers that have been pretreated by etching, the nature of reactions occurring at the interface between a primer and a substrate or between a primer and an adhesive, and the orientation of molecules adsorbed onto substrates. Surface analysis has also enabled adhesion scientists to determine the mechanisms responsible for failure of adhesive bonds, especially after exposure to aggressive environments. The objective of this chapter is to review the principals of surface analysis techniques including attenuated total reflection (ATR) and reflection-absorption (RAIR) infrared spectroscopy. X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) and to present examples of the application of each technique to important problems in adhesion science. 

The different examples presented in this review show the large range of possible applications of ToF-SIMS in the cultural heritage field. We have seen that it can be used for the characterization of different kinds of materials such as polymers, fibres and textiles, painting materials or biological samples, but any other material could be considered. 

SIMS comes in view. We are not aware of applications in the fields of catalyst characterization or in catalytic surface chemistry, however. 

In spite of the excellent capability and advantages (high selectivity and sensitivity) of RIMS for the ultratrace analysis of isotopes with naturally rare abundance in environmental, geological, medical and nuclear samples, no commercial instrumentation is available to date. In contrast to AMS and RIMS as mono-elemental (element-specific) analytical techniques, ICP-MS and LA-ICP-MS possess, in analogy to GDMS and SIMS, have the ability for multi-element analysis and thus could have the widest fields of application. 

Several other microanalytical methods in common use potentially have application on soil and sediments section samples. Laser-ablation inductively coupled plasma mass spectrometery (LA-ICP-MS) has been used on soil thin-sections from a controlled field experiment (21) but required special resins in the preparation. There is presently (May 2006) no reported use of this method on archaeological soil samples. Likewise, for extremely fine-resolution studies (i.e. <10 pm) with low minimum detection limits and despite difficult calibration, secondary ion microscopy (SIMS) has a potential role in examining archaeological soil thin sections. At even higher lateral resolutions ( 100 nm) Auger electron spectroscopy (AES) could also be considered for surface (<5 nm deep) analyses. At present however, the use of these methods in soil systems is limited. SIMS has been focused on biochemical applications (22), whereas AES... 

Earlier DI techniques include fast atom bombardment (FAB), secondary ionization mass spectrometry (SIMS), plasma desorption, and field desorption. Since their applications are primarily qualitative, they will not be discussed here. 

But what about Inorganic SIMS Here the field Is Indeed more mature with the advent of the ims-3f by CAMECA Thomson-CSF In 1978 (5). But there are still a few Interesting Instrumental aspects to explore, one of which Is the application of ultra-flnely focussed Ion beams (18). 

The application of molecular SIMS as a sensitive ionization source for nonvolatile and thermally labile molecules compares favorably with other new ionization methods in mass spectrometry such as field desorption (FD), Californium-252 plasma desorption (PD), fast heavy ion induced desorption (FHIID), laser desorp-... 

An alternative for the low detection efficiencies of the emitted particles is to ionize them with a UV laser beam, either in a resonant or non-resonant manner [46]. In this way, the ionization efficiency is increased about 1000-fold and the attractive perspective of performing SNMS under static conditions at sensitivities comparable to those of SIMS comes into the reckoning. As yet, however, we are not aware of any applications in the fields of catalyst characterization or in catalytic surface chemistry. 

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