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Silicon current-voltage characteristics

To make the entire eleetronic response linear with respect to tunneling gap s, a logarithmic amplifier is attached at the output of the current amplifier. A logarithmic amplifier can be made from a feedback amplifier, by replacing the feedback resistor with a diode, as shown in Fig. 11.4. The current-voltage characteristics of a good-quality, forward-biased silicon diode follow an exponential law over more than five orders of magnitude ... [Pg.257]

Fig. 8. Current-voltage characteristics of two hypothetical devices of identical physical size. The gallium arsenide curve rises faster and reaches peak velocity faster than the silicon. This means that the group III-V (13-15) electrons produce significantly faster operating times in microchips. (AT T Technology)... Fig. 8. Current-voltage characteristics of two hypothetical devices of identical physical size. The gallium arsenide curve rises faster and reaches peak velocity faster than the silicon. This means that the group III-V (13-15) electrons produce significantly faster operating times in microchips. (AT T Technology)...
Fig. 8. Current-voltage characteristic of a p-i-n cell fabricated on a glass substrate r]= 10.1%, area = 1.09 cm2. Vx = 0.84 V, Jm — 1.78 mA cm-2, FF = 0.676, illumination = 98.62 mW cm-2, T= 25.7°C. [From Catalano et al., Attainment of 10% conversion efficiency in amorphous silicon solar cells. Conf. Rec. IEEE Photovoltaic Spec. Conf., Vol. 16, 1982 IEEE.]... Fig. 8. Current-voltage characteristic of a p-i-n cell fabricated on a glass substrate r]= 10.1%, area = 1.09 cm2. Vx = 0.84 V, Jm — 1.78 mA cm-2, FF = 0.676, illumination = 98.62 mW cm-2, T= 25.7°C. [From Catalano et al., Attainment of 10% conversion efficiency in amorphous silicon solar cells. Conf. Rec. IEEE Photovoltaic Spec. Conf., Vol. 16, 1982 IEEE.]...
The description of the current-voltage characteristics is essentially the same as for the equivalent crystalline silicon devices, with some modifications to account for the localized states near the band edges. The accumulation charge, Q/, per unit area of channel is... [Pg.374]

Fig. 10.8 Current-voltage characteristics of a polypyrrole/n-silicon diode. Fig. 10.8 Current-voltage characteristics of a polypyrrole/n-silicon diode.
The data of Efimov and Erusalimchik (5) shown in Fig.l give an example of the different current-voltage characteristics obtained with various resistivity n- and p-type germanium electrodes made anode in 0.1 N HC1. Brattain and Garrett (4) and others (7-10), however, found much lower saturation current densities by one to two orders of magnitude with n-type germanium made anode in similar electrolytes. Similar curves for n-type silicon would show saturation current densities in the order of microamperes per square centimeter. [Pg.288]

Figure 5.28 Current-voltage characteristic of field emission from a nanodiamond particle on a silicon substrate doped with nitrogen. The turn-on field intensity (attainment of a 0.1 iA current) is 3.2Vpm", and at 5Vpm" a current density of about 95 mAcm" is attained ( Elsevier 2000). Figure 5.28 Current-voltage characteristic of field emission from a nanodiamond particle on a silicon substrate doped with nitrogen. The turn-on field intensity (attainment of a 0.1 iA current) is 3.2Vpm", and at 5Vpm" a current density of about 95 mAcm" is attained ( Elsevier 2000).
FIGURE 2-16 Current-voltage characteristics of a silicon semiconductor diode. (For clarity the small current under reverse bias before breakdown has been greatly exaggerated.)... [Pg.46]

Silicon nanostructures can be obtained in acidic fluoride-containing media or in alkaline solution at potentials negative from open circuit potential. The (photo) current-voltage characteristic of Si in fluoride-containing electrolytes reveals a series of phenomena which have attracted considerable attention in chemistry, physics, and solar energy conversion. Figure 2.39 provides an overview of these processes for both n- and p-type Si. The I-Vcurve is characterized by two maxima and periodic variations at higher applied anodic potential. These photocurrent... [Pg.107]

All current-voltage characteristics of the photovoltaic devices were measured with a source measure imit in the dark and under simulated solar simulator source was calibrated using a standard crystalline silicon diode. The ciurent-voltage characteristics of Photovoltaic devices are generally characterized by the short-circuit current (/ ), the open-circuit voltage (F ), and the fill factor (FF). The photovoltaic power conversion efficiency (rj) of a solar cell is defined as the ratio between the maximum electrical power and the incident optical power and is determined byEq.(l)[4]. [Pg.83]

Fig. 5.37. Current voltage characteristic at various temperatures of evaporated silicon oxide films (after Servini and Jonscher (1969)). Fig. 5.37. Current voltage characteristic at various temperatures of evaporated silicon oxide films (after Servini and Jonscher (1969)).
Koshida N, Nagasu M, Sakusabe T, Kiuchi Y (1985) The current voltage characteristics of a photoelectrochemical cell using p-type porous silicon. J Electrochem Soc 132(2) 346-349 Koshida N, Nagasu M, Echizenya K, Kiuchi Y (1986) Impedance spectra of p-type porous Si-electrolyte interfaces. J Electrochem Soc 133(11) 2283-2287 Mamykin AI, Moshnikov VA, Ilin AY (1998) Magnetic resonance spectroscopy of porous quantum-size structures. Semiconductors 32(3) 322-324... [Pg.331]

Diligenti A, Nannini A, Pennelli G et al (1996) Electrical characterization of metal Schottky contacts on luminescent porous silicon. Thin Sohd Films 276 179-182 Dimitrov DB (1995) Current-voltage characteristics of porous silicon layer. Phys Rev... [Pg.366]

Simons AJ, Cox TI, Uren MJ et al (1995) The electrical properties of porous silicon produced from n + silicon substrates. Thin Solid Films 255 12-15 Skryshevsky VA, Strikha VI, Mamikin AV et al (1998) Availability of current -voltage characteristics for porous silicon gas sensors, Discrete gas sensor. Paper presented at eorosensors XII13-16 Sept 277-280... [Pg.367]

Field emission measurement was carried out on the ZnO nanorods array grown on silicon, as shown in Figure 5.7(a). The experiments were performed in a vacuum chamber with a base pressure of 1 x 10 Torr. The distance between an indium tin oxide anode and the sample is 150 pm. The measured emission area is 0.20 cm. The emission current-voltage characteristics are analyzed using the... [Pg.102]

For n-type silicon under illumination, the current-voltage curves are dependent on illumination intensity, as shown in Fig. 40. At high illumination intensity, the eur-rent-voltage curves exhibit two current peaks, as seen for p-type silicon. At lower illumination intensities the photocurrent is limited by the supply of photogenerated holes and exhibits a characteristic plateau. [Pg.117]

Due to the technological importance of metal-insulator-semiconductor (MIS) devices, understanding of the nature of their electrical characteristics such as current-voltage (1-V) and tunnel magnetoresistance (TMR) is of great interest. Unless intentionally fabricated, a silicon Schottky diode possesses a thin interfacial oxide layer between the metal and the semiconductor. Additionally, a density of interface states is always generated at the boundary between the semiconductor and insulator. [Pg.307]

Figure 7.9 (a) Comparison of current density-voltage characteristics for a high-efficiency silicon solar... [Pg.477]


See other pages where Silicon current-voltage characteristics is mentioned: [Pg.578]    [Pg.252]    [Pg.417]    [Pg.312]    [Pg.317]    [Pg.319]    [Pg.70]    [Pg.52]    [Pg.5]    [Pg.3805]    [Pg.255]    [Pg.682]    [Pg.507]    [Pg.426]    [Pg.478]    [Pg.208]    [Pg.417]    [Pg.157]    [Pg.461]    [Pg.435]    [Pg.43]    [Pg.167]    [Pg.123]    [Pg.182]    [Pg.190]    [Pg.319]    [Pg.83]    [Pg.476]   
See also in sourсe #XX -- [ Pg.107 , Pg.109 , Pg.126 , Pg.128 ]




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