Scanning tunneling microscopy , optically

A wide variety of measurements can now be made on single molecules, including electrical (e.g. scanning tunnelling microscopy), magnetic (e.g. spin resonance), force (e.g. atomic force microscopy), optical (e.g. near-field and far-field fluorescence microscopies) and hybrid teclmiques. This contribution addresses only Arose teclmiques tliat are at least partially optical. Single-particle electrical and force measurements are discussed in tire sections on scanning probe microscopies (B1.19) and surface forces apparatus (B1.20). 

Valette-Hamelin approach,67 and other similar methods 24,63,74,218,225 (2) mass transfer under diffusion control with an assumption of homogeneous current distribution73 226 (3) adsorption of radioactive organic compounds or of H, O, or metal monolayers73,142,227 231 (4) voltammetry232,233 and (5) microscopy [optical, electron, scanning tunneling microscopy (STM), and atomic force microscopy (AFM)]234"236 as well as a number of ex situ methods.237 246... 

An unusually extensive battery of experimental techniques was brought to bear on these comparisons of enantiomers with their racemic mixtures and of diastereomers with each other. A very sensitive Langmuir trough was constructed for the project, with temperature control from 15 to 40°C. In addition to the familiar force/area isotherms, which were used to compare all systems, measurements of surface potentials, surface shear viscosities, and dynamic suface tensions (for hysteresis only) were made on several systems with specially designed apparatus. Several microscopic techniques, epi-fluorescence optical microscopy, scanning tunneling microscopy, and electron microscopy, were applied to films of stearoylserine methyl ester, the most extensively investigated surfactant. 

Other more advanced microscopic techniques have been developed, including near-held scanning optical microscopy [166] and scanning probe microscopy techniques, such as atomic force microscopy and scanning tunnelling microscopy [166, 167],... 

A number of methods are available for the characterization and examination of SAMs as well as for the observation of the reactions with the immobilized biomolecules. Only some of these methods are mentioned briefly here. These include surface plasmon resonance (SPR) [46], quartz crystal microbalance (QCM) [47,48], ellipsometry [12,49], contact angle measurement [50], infrared spectroscopy (FT-IR) [51,52], Raman spectroscopy [53], scanning tunneling microscopy (STM) [54], atomic force microscopy (AFM) [55,56], sum frequency spectroscopy. X-ray photoelectron spectroscopy (XPS) [57, 58], surface acoustic wave and acoustic plate mode devices, confocal imaging and optical microscopy, low-angle X-ray reflectometry, electrochemical methods [59] and Raster electron microscopy [60]. 

Introduction to scanning tunneling microscopy / C. Julian Chen, p. cm. (Oxford series in optical and imaging sciences 4) Includes bibliographical references (p. ) and index. 

Powerful methods that have been developed more recently, and are currently used to observe surface micro topographs of crystal faces, include scanning tunnel microscopy (STM), atomic force microscopy (AFM), and phase shifting microscopy (PSM). Both STM and AFM use microscopes that (i) are able to detect and measure the differences in levels of nanometer order (ii) can increase two-dimensional magnification, and (iii) will increase the detection of the horizontal limit beyond that achievable with phase contrast or differential interference contrast microscopy. The presence of two-dimensional nuclei on terraced surfaces between steps, which were not observable under optical microscopes, has been successfully detected by these methods [8], [9]. In situ observation of the movement of steps of nanometer order in height is also made possible by these techniques. However, it is possible to observe step movement in situ, and to measure the surface driving force using optical microscopy. The latter measurement is not possible by STM and AFM. 

Mineral-liquid or mineral-gas interfaces under reactive conditions cannot be studied easily using standard UHV surface science methods. To overcome the pressure gap between ex situ UHV measurements and the in situ reactivity of surfaces under atmospheric pressure or in contact with a liquid, new approaches are required, some of which have only been introduced in the last 20 years, including scanning tunneling microscopy [28,29], atomic force microscopy [30,31], non-linear optical methods [32,33], synchrotron-based surface scattering [34—38], synchrotron-based X-ray absorption fine structure spectroscopy [39,40], X-ray standing wave... 

C. J. Chen, Introduction to Scanning Tunneling Microscopy, Oxford Series in Optical and Imaging Sciences, Vol. 4, Oxford University Press, New York, 1993. 

Three major advancements in resolution have occurred since Hookes s discovery of the optical microscope in 1665 [46]. In 1873, Ernst Abbe established fundamental criteria for the resolution limit in optical microscopy [47], which did not exceed the range of a couple of 100 nanometers even after the introduction of the confocal optical microscope [43,48]. The invention of the transmission electron microscope by Ernst Ruska in 1933 extended the resolution of microscopes to the nanometer scale [49]. Finally, scanning tunnelling microscopy introduced, by Binnig and Rohrer in 1981, made a breakthrough when atomic... 

Development of scanning tunnel microscopy (STM) by Gerd Binnig and Heinrich Rohrer in 1981 pointed the way to breakthroughs in understanding basic chemical processes. Since then, STM and atomic force microscopy (AFM), as well as optical force microscopy proximal probes,1 have been used to manipulate individual atoms and molecules on surfaces. 

The oldest microscopy technique for materials analysis was optical microscopy. Even to this day, for feature sizes above 1 pm, this is one of the most popular tools. For smaller features, electron microscopy techniques such as scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are the tools of choice. A third family of microscopy includes scanning probe tools such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In these relatively recent techniques, sample preparation concerns are of minor importance compared to other problems, such as vibration isolation and processing of atomically sharp probes. Therefore, the latter techniques are not discussed here. This chapter is aimed at introducing the user to general specimen preparation steps involved in optical and electron microscopy [3 7], which to date are the most common... 

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