Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Scanning tunneling microscope, advantages

While the first STM studies of electrode surfaces were performed with self-built instruments, scanning tunneling microscopes for electrochemical use are nowadays commercially available at a price that hardly justifies the effort of homemade equipment. Nevertheless, new instrumental designs are now and then discussed in the literature, which are still worthwhile to be considered for special applications. There is, however, additional equipment required for the operation of an electrochemical STM, for which homemade designs may be advantageous over commercially available ones and hence is briefly mentioned here in terms of tip preparation and isolation, the electrochemical cell, and vibration damping. [Pg.124]

The scanning tunneling microscope is also a tool for surface morphological studies that is widely used in situ [73], It is based on the analysis of a tunneling current between a very sharp microscopic tip and the electrode surface caused by a bias potential applied between the two. This method is well established for the study of electrochemical systems [58,59,74-76], Its advantage over AFM is that it is technically much simpler to use for in situ studies of electrochemical systems, and it obtains better resolution. However, the application of STM to nonaqueous systems may be complicated by the following factors ... [Pg.126]

FIGURE 10.10 A commercial scanning tunneling microscope (STM). Invented in the early 1980s, STMs take advantage of a quantum-mechanical phenomenon. [Pg.315]

Due to such advantages as high resolution that can approach the real atomic and molecular scale, and the ability to perform real-time measurement that cannot be matched by traditional microscopy, scanning tunneling microscopy (STM) and atomic force microscopy (AFM) have attracted considerable attention since their introduction from researchers in various fields. The operational procedure of these microscopes is to position an atomically sharp detector needle to less than several nanometers from the surface of a sample, probe the interaction between the detector needle and the sample, scan the sample surface two-dimensionally, and obtain the surface image (an unprecedented method). If the interaction that is probed is the tunneling of the electron that is well known in quantum mechanics, the technique is called STM (T indicates tunneling). If, on the other hand, atomic force (van der Waals force) is used, it is called AFM. [Pg.235]


See other pages where Scanning tunneling microscope, advantages is mentioned: [Pg.219]    [Pg.227]    [Pg.350]    [Pg.247]    [Pg.369]    [Pg.369]    [Pg.62]    [Pg.170]    [Pg.338]    [Pg.641]    [Pg.47]    [Pg.451]    [Pg.339]    [Pg.706]    [Pg.752]    [Pg.125]    [Pg.97]    [Pg.536]    [Pg.576]    [Pg.253]    [Pg.568]    [Pg.22]    [Pg.170]    [Pg.540]    [Pg.32]    [Pg.500]    [Pg.1058]    [Pg.297]    [Pg.11]    [Pg.62]    [Pg.43]    [Pg.280]    [Pg.255]    [Pg.74]    [Pg.1]    [Pg.319]    [Pg.4590]    [Pg.4700]    [Pg.178]    [Pg.301]    [Pg.353]   


SEARCH



Scanning Tunneling Microscop

Scanning microscope

Scanning tunneling

Scanning tunneling microscope

Scanning tunneling microscopic

Scanning tunneling microscopic scans

Scanning tunnelling

Scanning tunnelling microscope

Scanning tunnelling microscopic

Tunneling microscopes

© 2024 chempedia.info