Scanning tunneling atomic force

Microscopy electron, light (with video enhancement), scanning tunneling, atomic forces, IR microscopy, NMR imaging, thermal and magnetic domain microscopy. 

Scanning electron microscope Scanning tunneling/atomic force microscopes 3-6nm <0.2nm 10-250,000X Surfaces Surfaces... 

The most recent developments in determining the surface structure are the scanning tunneling microscope (STM) and the scanning or atomic force microscope (SFM or AFM) [36, 37]. These techniques are capable of imaging the local surface... 

The ability to control the position of a fine tip in order to scan surfaces with subatomic resolution has brought scanning probe microscopies to the forefront in surface imaging techniques. We discuss the two primary techniques, scanning tunneling microscopy (STM) and atomic force microscopy (AFM) the interested reader is referred to comprehensive reviews [9, 17, 18]. 

We have considered briefly the important macroscopic description of a solid adsorbent, namely, its speciflc surface area, its possible fractal nature, and if porous, its pore size distribution. In addition, it is important to know as much as possible about the microscopic structure of the surface, and contemporary surface spectroscopic and diffraction techniques, discussed in Chapter VIII, provide a good deal of such information (see also Refs. 55 and 56 for short general reviews, and the monograph by Somoijai [57]). Scanning tunneling microscopy (STM) and atomic force microscopy (AFT) are now widely used to obtain the structure of surfaces and of adsorbed layers on a molecular scale (see Chapter VIII, Section XVIII-2B, and Ref. 58). On a less informative and more statistical basis are site energy distributions (Section XVII-14) there is also the somewhat laige-scale type of structure due to surface imperfections and dislocations (Section VII-4D and Fig. XVIII-14). 

We confine ourselves here to scanning probe microscopies (see Section VIII-2B) scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in which successive profiles of a surface (see Fig. VIII-1) are combined to provide a contour map of a surface. It is conventional to display a map in terms of dark to light areas, in order of increasing height above the surface ordinary contour maps would be confusing to the eye. 

There has been a general updating of the material in all the chapters the treatment of films at the liquid-air and liquid-solid interfaces has been expanded, particularly in the area of contemporary techniques and that of macromolecular films. The scanning microscopies (tunneling and atomic force) now contribute more prominently. The topic of heterogeneous catalysis has been expanded to include the well-studied case of oxidation of carbon monoxide on metals, and there is now more emphasis on the flexible surface, that is, the restructuring of surfaces when adsorption occurs. New calculational methods are discussed. 

Giancarlo L C and Flynn G W 1988 Scanning tunneling and atomic force microscopy probes of self-assembled, physisorbed monolayers A/ / . Rev. Phys. Chem. 49 297... 

Flansma P K, Elings V B, Marti O and Bracker C E 1988 Scanning tunnelling microscopy and atomic force microscopy application to biology and technology Science 242 209... 

A wide variety of measurements can now be made on single molecules, including electrical (e.g. scanning tunnelling microscopy), magnetic (e.g. spin resonance), force (e.g. atomic force microscopy), optical (e.g. near-field and far-field fluorescence microscopies) and hybrid teclmiques. This contribution addresses only Arose teclmiques tliat are at least partially optical. Single-particle electrical and force measurements are discussed in tire sections on scanning probe microscopies (B1.19) and surface forces apparatus (B1.20). 

Newer techniques that are responding to the need for atomic level imaging and chemical analysis include scanning tunneling microscopes (STMs), atomic force microscopes (AFMs) (52), and focused ion beams (FIBs). These are expected to quickly pass from laboratory-scale use to in-line monitoring apphcations for 200-mm wafers (32). 

The very new techniques of scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) have yet to establish themselves in the field of corrosion science. These techniques are capable of revealing surface structure to atomic resolution, and are totally undamaging to the surface. They can be used in principle in any environment in situ, even under polarization within an electrolyte. Their application to date has been chiefly to clean metal surfaces and surfaces carrying single monolayers of adsorbed material, rendering examination of the adsorption of inhibitors possible. They will indubitably find use in passive film analysis. 

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