Scanning potential microscope

Computers will be integrated more and more into commercial SEMs and there is an enormous potential for the growth of computer supported applications. At the same time, related instruments will be developed and extended, such as the scanning ion microscope, which uses liquid-metal ion sources to produce finely focused ion beams that can produce SEs and secondary ions for image generation. The contrast mechanisms that are exhibited in these instruments can provide new insights into materials analysis. 

Whilman, L.J. and Colton, R.J., Design and calibration of a scanning force microscope for friction, adhesion, and contact potential studies. Rev. Sci. fnsirum., 66, I (1995). Ba.selt, D.R. and Baldeschwieler, J.D., Imaging spectro.scopy with the atomic-force microscope. J. AppL Pliys., 76(1), 33-38 (1994). 

The basis of the scanning tunnelling microscope, illustrated schematically in Figure 3.5, lies in the ability of electronic wavefunctions to penetrate a potential barrier which classically would be forbidden. Instead of ending abruptly at a... 

The scanning tunneling microscope (STM) is an excellent device to obtain topographic images of an electrode surface [1], The principal part of this apparatus is a metal tip with a very fine point (see Fig. 15.1), which can be moved in all three directions of space with the aid of piezoelectric crystals. All but the very end of the tip is insulated from the solution in order to avoid tip currents due to unwanted electrochemical reactions. The tip is brought very close, up to a few Angstroms, to the electrode surface. When a potential bias AF, usually of the order... 

Since the deviation of device characteristics may come from the local heterogeneity of metal/molecule interfaces, the local characterization of the molecular structure and interfaces is necessary to learn how to alter processes and materials in order to achieve high yield, stable process condition, and low deviations of device characteristics. A few researchers have proposed the use of the scanning probe microscopic technique [conducting probe AFM, surface potential... 

Danesi et al.96 applied SIMS, in addition to X-ray fluorescence imaging, by using a microbeam (p-XRF) and scanning electron microscope equipped with an energy dispersive X-ray fluorescence analyzer (SEM-EDXRF) to characterize soil samples and to identify small DU particles collected in Kosovo locations where depleted uranium (DU) ammunition was employed during the 1999 Balkan conflict. Knowledge of DU particles is needed as a basis for the assessment of the potential environmental and health impacts of military use of DU, since it provides information on possible resuspension and inhalation. The measurements indicated spots where hundreds of thousands of particles may be present in a few mg of contaminated soil. The particle size distribution showed that most of the DU particles were < 5 pm in diameter and more than 50 % of the particles had a diameter of < 1.5 p.m.96... 

The second class of atomic manipulations, the perpendicular processes, involves transfer of an adsorbate atom or molecule from the STM tip to the surface or vice versa. The tip is moved toward the surface until the adsorption potential wells on the tip and the surface coalesce, with the result that the adsorbate, which was previously bound either to tine tip or the surface, may now be considered to be bound to both. For successful transfer, one of the adsorbate bonds (eiLher with the tip or with the surface, depending on the desired direction of transfer) mnst be broken. The fate of the adsorbate depends on the nature of its interaction with the tip and the surface, and the materials of the tip and surface. Directional adatom transfer is possible with the application of suitable junction biases. See also Scanning Tunneling Microscope. 

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