Scanned Probe Microscopy instrumentation

A Practical Guide to Scanning Probe Microscopy, Park Scientific Instruments, p. 6. 

There are numerous modern developments that have made atomic-scale resolution possible in recent years. In fact, some of these developments in instruments can also be used to measure forces between particles and surfaces. These developments for force measurements are discussed briefly in Section 1.6c and in Vignette 1.8. In this section, we review electron and scanning probe microscopies (SPMs), which allow atomic-scale visualization of surfaces and particles. 

Only recent developments in instrumentation of scanning probe microscopy, such as scanning tunneling microscopy (8) and atomic force microscopy (9), have made it possible to study friction on the nanometer and higher scales. These experiments show that the behavior on the single asperity level is different from that on the macroscopic scale. 

Scanning Probe Microscopy (2000) Training Notebook, Digital Instruments, Veeco Metrology Group, Santa Barbara, CA, p 40... 

A particularly interesting approach for probing electrode reactions at the micro-level has arisen from the combination of microelectrodes and the accurate control instrumentation associated with scanning probe microscopies. 

Fundamentals of Scanning Probe Microscopy and Basic Instrumentation... 

In both real space and reciprocal space there have been tremendous instrumental advances in the last decade, whose benefits are still being appreciated in the polymer field. A wealth of new microscopies have been developed, which seem particularly suited to this area of biological polymeric systems. With the exception of the scanning probe microscopies, which do seem fairly widespread, many of these are almost certainly not yet playing as important a role that they have the potential to do. Thus the general field of new microscopies seems likely to be one of rapid expansion in its application to the sort of systems of interest here, and some specific (rather than exhaustive) examples will be mentioned. 

K,D. Jandt, Developments and Perspectives of Scanning Probe Microscopy (SPM) on Organic Materials Systems, Mater. Set Eng. Reports 21 (1998) 221-295, (Recent developments in instrumentation and particularities in connection with SPM on... 

There is another interest in nanoscale science and technology, i.e., the observation of nanometer-size structures with scanning probe microscopies (SPMs). Among the SPMs, several kinds of methods to directly image magnetic structures have been developed. The instrument most widely used now is magnetic force microscopy (MFM), which has a high spatial resolution on a 10-nm scale. 

Overview of scanning probe microscopy techniques produced by Nanoscience Instruments Inc... 

A wide range of techniques can be used to capture the surface roughness of a component using noncontact methods. Some of the more common instruments used to captore topographic data include confocal microscopy, laser triangulation, focus detection, and optical interferometry. A relatively recent branch of microscopy known as scanning probe microscopy (SPM) yields over 20 other instruments which are defined based on what probe-surface interaction they are monitoring. The SPM family is described in more detail elsewhere in this book and will be briefly mentioned in this article. 

Bhushan, B. and Marti, O. (2005) Scanning probe microscopy - principle of operation, instrumentation, and probes, inNanotribology andNartomechanics (ed. B. Bhushan), Springer, Berlin, Heidelberg, New York, pp. 41—115. 

Prof. Whitesides also supported the concept of shared facilities, but on a somewhat more sober note. He felt that all too often, we all want to have access to all the instruments rather than just to what is truly needed. Much of what is needed is actually quite inexpensive. He illustrated this in the case of scanning probe microscopy, which, in his view, is one of the most important instrumental advances of the last decade. Much can be done with such sinq>le instruments, and... 

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