Scan electron microscopy

SEM Scanning electron microscopy [7, 10, 14] A beam of electrons scattered from a surface is focused Surface morphology... 

R. E. Lee, Scanning Electron Microscopy and X-Ray Microanalysis, PTR Prentice Hall, Englewood Cliffs, NJ, 1993. 

P. R. Thornton, Scanning Electron Microscopy, Chapman and Hall, 1968. See also Scanning Electron Microscopy Systems and Applications, The Institute of Physics, London, 1973. 

Reimer L 1998 Scanning Electron Microscopy (Berlin Springer)... 

Otlier fonns of microscopy have been used to evaluate nanocrystals. Scanning electron microscopy (SEM), while having lower resolution tlian TEM, is able to image nanoparticles on bulk surfaces, for direct visualization of... 

Additional information on elastomer and SAN microstmcture is provided by C-nmr analysis (100). Rubber particle composition may be inferred from glass-transition data provided by thermal or mechanochemical analysis. Rubber particle morphology as obtained by transmission or scanning electron microscopy (101) is indicative of the ABS manufacturing process (77). (See Figs. 1 and 2.)... 

Physical testing appHcations and methods for fibrous materials are reviewed in the Hterature (101—103) and are generally appHcable to polyester fibers. Microscopic analyses by optical or scanning electron microscopy are useful for evaluating fiber parameters including size, shape, uniformity, and surface characteristics. Computerized image analysis is often used to quantify and evaluate these parameters for quaUty control. 

The very high powers of magnification afforded by the electron microscope, either scanning electron microscopy (sem) or scanning transmission electron microscopy (stem), are used for identification of items such as wood species, in technological studies of ancient metals or ceramics, and especially in the study of deterioration processes taking place in various types of art objects. 

Particle Size. Wet sieve analyses are commonly used in the 20 )J.m (using microsieves) to 150 )J.m size range. Sizes in the 1—10 )J.m range are analyzed by light-transmission Hquid-phase sedimentation, laser beam diffraction, or potentiometric variation methods. Electron microscopy is the only rehable procedure for characterizing submicrometer particles. Scanning electron microscopy is useful for characterizing particle shape, and the relation of particle shape to slurry stabiUty. 

Asbestos fiber identification can also be achieved through transmission or scanning electron microscopy (tern, sem) techniques which are especially usefiil with very short fibers, or with extremely small samples (see Microscopy). With appropriate peripheral instmmentation, these techniques can yield the elemental composition of the fibers using energy dispersive x-ray fluorescence, or the crystal stmcture from electron diffraction, selected area electron diffraction (saed). 

Occasionally, especially in the developmental phase of catalyst research, it is necessary to determine the oxidation state, exact location, and dispersion of various elements in the catalyst. Eor these studies, either transmission electron microscopy (TEM) or scanning electron microscopy (SEM) combined with various high vacuum x-ray, electron, and ion spectroscopies are used routinely. 

L. Rcimer. Scanning Electron Microscopy. Springer-Verlag, Berlin, 1985. An advanced text for experts, this is probably the most definitive work in the field. 

E. Lifshin. Scanning Electron Microscopy and X-Ray Analysis. Plenum Press, New York, 1981. Developed from a short course held aimually at Lehigh University. The book is concerned with the use and applications of SEM. In the latter context a lengthy discussion of EDS is given. The discussion... 

A. J. Bevolo. Scanning Electron Microscopy. 1985, vol. 4, p. 1449. (Scanning Electron Microscopy, Inc. Elk Grove Village, IL) Thorough exposition of the principles and applications of reflected electron energy-loss microscopy (REELM) as well as a comparison to other techniques, such as SAM, EDS and SEM. 

Scanning Electron Microscopy Scanning Electron Microprobe Secondary Electron Miscroscopy Secondary Electron Backscatteted Electron... 

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