Rutherford backscattering surface characterization

Techniques based on the interaction of ions with solids, such as secondary ion mass spectrometry (SIMS) and low-energy ion scattering (LEIS) have undoubtedly been accepted in catalyst characterization, but are by no means as widely applied as for example X-ray photoelectron spectroscopy (XPS) or X-ray diffraction (XRD). Nevertheless, SIMS, with its unsurpassed sensitivity for many elements, may yield unique information on whether or not elements on a surface are in contact with each other. LEIS is a surface technique with true outer layer sensitivity, and is highly useful for determining to what extent a support is covered by the catalytic material. Rutherford backscattering (RBS) is less suitable for studying catalysts, but is indispensable for determining concentrations in model systems, where the catalytically active material is present in monolayer (ML)-like quantities on the surface of a flat model support. 

L.C. Feldman. Rutherford Backscattering and Nuclear Reaction Analysis. In A.W. Czandema and D.M. Hercules, editors. Ion Spectroscopies for Surface Analysis. Methods of Surface Characterization, Volume 2. Plenum Press, New York, 1991. 

Baumann SM (1992) RBS Rutherford backscattering spectrometry. In Encyclopedia of materials characterization, surfaces, interfaces, thin films. Elsevier, Greenwich, pp 476-487... 

Hashimoto, H., Ohno, A., Nakajima, K., Suzuki, M., Tsuji, H., and Kimura, K. (2010) Surface characterization of imida-zolium ionic liquids by high-resolution Rutherford backscattering spectroscopy and X-ray photoelectron spectroscopy. Sutf. Sci., 604, 464-469. 

In addition to these characterization tools, surface analytical techniques such as surface matrix-assisted laser desorption ionization (Surface MALDI) mass spectrometry, Rutherford backscattering spectroscopy (RBS), and near-edge X-ray absorption fine stmcture spectroscopy (NEXAFS) are used to obtain structural and chemical details about surface thin films. Surface MALDI, also known as MALDI-ToF MS (see Section 5.4.2), offers high mass resolution for analyzing surface films and molecular layers using the m/z of various ions generated from the sample surface (mixed with an... 

Depth profiling (characterization) The determination of elemental composition as a function of distance from the surface. The analysis may be destructive (Example sputter profiling using auger electron spectroscopy (AES)) or non-destructive (Example profiling using Rutherford backscattering spectrometry (RBS)). 

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