High-resolution Rutherford backscattering

Similarly, a study of the anions [PFg] and [DCA] by high-resolution Rutherford backscattering (HRBS) also revealed that both cation and anions are at the surface, and the alkyl chains of both ion types point away from the surface into the vacuum phase. The experimental data initially showed hints toward carbon enrichment and nitrogen depletion at the uppermost surface layers that might indicate unequal distribution of cation and anion at the surface, but the signals were actually due to... 

Nakajima, K., Ohno, A., Suzuki, M., and Kimura, K. (2008) Observation of molecular ordering at the surface of Trimethylpropylammonium Bis(trifluoromethanesulfonyl)imide using high-resolution Rutherford Backscattering spectroscopy. langjnuir, 24, 4482-4484. 

Quantification in shallow profiles is another issue for quantitative analysis with SIMS. Matrix effects and sputtering rate changes are necessary considerations in quantification of shallow profiles to obtain an accurate profile with concentration and depth scales [14]. Comparison to high resolution Rutherford backscattering (HRBS) data helps in evaluating shallow SIMS profiles [36]. 

IPM can be used simultaneously with RBS (Rutherford backscattering spectrometry), NRA (nuclear reaction analysis), PIXE (particle induced X-ray emission) or PIGE (particle induced gamma ray emission). More specialized examples include the field ion microscope (FIM), which gives better then atomic resolution in the study of high melting point materials. 

In addition to these characterization tools, surface analytical techniques such as surface matrix-assisted laser desorption ionization (Surface MALDI) mass spectrometry, Rutherford backscattering spectroscopy (RBS), and near-edge X-ray absorption fine stmcture spectroscopy (NEXAFS) are used to obtain structural and chemical details about surface thin films. Surface MALDI, also known as MALDI-ToF MS (see Section 5.4.2), offers high mass resolution for analyzing surface films and molecular layers using the m/z of various ions generated from the sample surface (mixed with an... 

Equation [1 ] indicates that for optimum spatial resolution, high-yield analytical reactions are required. Ion beam analysis (BA) techniques are discussed elsewhere in this volume and here it is shown that the highest cross-section reactions are PIXE and Rutherford backscattering (RBS), which together cover almost the whole of the periodic table. Nuclear reaction analysis has in general a much lower cross-section and is not routinely used for high-resolution microbeam applications. 

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