Rutherford backscattering spectroscop

Ti content in the polymer films was measured with a Princeton Gamma Tech System 4 x-ray Fluorescence Spectrometer. The conditions employed were Cr target, 50 keV source operating at 3 mA, 0.75 mm aperture, 4.8 mm beam stop, helium atmosphere and 100 sec. counting time. A calibration curve was constructed by plotting the fluorescence counts versus the amount of Ti in HB-HPR 206 films determined by Rutherford Backscattering Spectroscopic (RBS) analysis. 

SALI compares fiivorably with other major surface analytical techniques in terms of sensitivity and spatial resolution. Its major advantj e is the combination of analytical versatility, ease of quantification, and sensitivity. Table 1 compares the analytical characteristics of SALI to four major surfiice spectroscopic techniques.These techniques can also be categorized by the chemical information they provide. Both SALI and SIMS (static mode only) can provide molecular fingerprint information via mass spectra that give mass peaks corresponding to structural units of the molecule, while XPS provides only short-range chemical information. XPS and static SIMS are often used to complement each other since XPS chemical speciation information is semiquantitative however, SALI molecular information can potentially be quantified direedy without correlation with another surface spectroscopic technique. AES and Rutherford Backscattering (RBS) provide primarily elemental information, and therefore yield litde structural informadon. The common detection limit refers to the sensitivity for nearly all elements that these techniques enjoy. 

Fig. 1.8 Possibilities for spectroscopic research in catalysis (for abbreviations, see Fig. 1.7). AFM Atomic force microscopy ESR Electron spin resonance RBS Rutherford backscattering SNMS secondary neutral mass spectrometry.

In situ methods permit the examination of the surface in its electrolytic environment with application of the electrode potential of choice. Usually they are favored for the study of surface layers. Spectroscopic methods working in the ultra high vacuum (UHV) are a valuable alternative. Their detailed information about the chemical composition of surface films makes them an almost inevitable tool for electrochemical research and corrosion studies. Methods like X-ray Photoelectron Spectroscopy (XPS), UV Photoelectron Spectroscopy (UPS), Auger Electron Spectroscopy (AES) and the Ion Spectroscopies as Ion Scattering Spectroscopy (ISS) and Rutherford Backscattering (RBS) have been applied to metal surfaces to study corrosion and passivity. 

The solid-state chemical, optical, and physical properties of the RE, Y, and Sc orthophosphates have been extensively investigated by means of numerous techniques. Such studies include optical spectroscopy (Trukhin and Boatner 1997), x-ray absorption (Shuh et al. 1994), electron paramagnetic resonance (EPR) spectroscopy (Abraham et al. 1981, Boatner et al. 1981b), Mossbauer (Huray et al. 1982), Rutherford backscattering (Sales et al. 1983), and other techniques. Additionally, scanning ellipsometry has been used by Jellison and Boatner (2000) to determine the spectroscopic refractive indices of the xenotime-structure RE orthophosphates. The extensive range of studies of these orthophosphates was motivated initially by the potential application of the orthophosphates to radioactive waste disposal and subsequently by the other applications... 

The techniques named in rows 5-7 of Table 21-1 detect a secondary beam of tons and are classified as ion spectroscopic techniques. These include secondary-ion mass spectrometry, ion-scattering spectroscopy, Rutherford backscattering spectroscopy, and laser-microprobe muss spectrometry. 

---