Quantitation scanning electron microscopy

The choice of techniques and their application is complicated by the aims of the analysis and whether or not this is quantitative. Scanning electron microscopy (SEM), for example, is widely applied to assess the extent of interfacial adhesion in filled polymer composites, usually through examination of fracture surfaces. However, the information obtained is generally non-quantitative, although estimates of interfacial shear strength are possible from fibre pull-out measurements in short-fibre reinforced polymer composites [55]. 

D. B. Holt. M. D. Muir. P. R. Grant. I. M. Boswarva Quantitative Scanning Electron Microscopy. Academic Press. London 1974. 

Scanning Electron Microscopy and X-Ray Microanalysis Principles of Electroanalytical Methods Potentiometry and Ion Selective Electrodes Polarography and Other Voltammetric Methods Radiochemical Methods Clinical Specimens Diagnostic Enzymology Quantitative Bioassay... 

Scanning electron microscopy and other experimental methods indicate that the void spaces in a typical catalyst particle are not uniform in size, shape, or length. Moreover, they are often highly interconnected. Because of the complexities of most common pore structures, detailed mathematical descriptions of the void structure are not available. Moreover, because of other uncertainties involved in the design of catalytic reactors, the use of elaborate quantitative models of catalyst pore structures is not warranted. What is required, however, is a model that allows one to take into account the rates of diffusion of reactant and product species through the void spaces. Many of the models in common use simulate the void regions as cylindrical pores for such models a knowledge of the distribution of pore radii and the volumes associated therewith is required. 

Scanning electron microscopy is commonly used to study the particle morphology of pharmaceutical materials. Its use is somewhat limited because the information obtained is visual and descriptive, but usually not quantitative. When the scanning electron microscope is used in conjunction with other techniques, however, it becomes a powerful characterization tool for pharmaceutical materials. 

Atomic force microscopy (AFM) is a commonly employed imaging technique for the characterization of the topography of material surfaces. In contrast to other microscopy techniques (e.g., scanning electron microscopy), AFM provides additional quantitative surface depth information and therefore yields a 3D profile of the material surface. AFM is routinely applied for the nanoscale surface characterization of materials and has been previously applied to determine surface heterogeneity of alkylsilane thin films prepared on planar surfaces [74,75,138]. 

Pirrie, D., Butcher, A. R., Power, M. R., Gottlieb, P., and Miller, G. L. (2004). Rapid quantitative mineral and phase analysis using automated scanning electron microscopy (QemSCAN) Potential applications in forensic geoscience, in Forensic Geoscience Principles, Techniques and Applications (K. Pye and D. J. Croft, Eds.). London Geological Society Special Publication 232, 103-122. 

Scanning electron microscopy (SEM) can provide a wealth of information about particle morphology however, it is not well suited for quantitative image analysis. 

Armstrong, J.T., Methods of quantitative analysis of individual microparticles with electron beam instruments, Scanning Electron Microscopy/1978, 1, 455, 1978. 

Birk D. (1989) Quantitative coal mineralogy of the Sydney Coalfield, Nova Scotia, Canada, by scanning electron microscopy, computerized image analysis, and energy-dispersive X-ray spectrometry. Can. J. Earth Sci. 27, 163-179. 

X-ray diffraction technique is a non-destructive analytical technique that reveals information about crystallographic structure, chemical composition and physical properties of nanostructured materials. UV/Vis spectroscopy is routinely used in the quantitative determination of films of nanostructured metal oxides. The size, shape (nanocomb and nanorods etc,) and arrangement of the nanoparticles can be observed through transmission electron microscope (TEM) studies. Surface morphology of nanostructured metal oxides can be observed in atomic force microscopy (AFM) and scanning electron microscopy (SEM) studies. 

The toxicity of the mineral is such that quantitative characterization of erionite is extremely important. Samples should be characterized by using one or more of the following techniques (1) powder X-ray diffraction, (2) electron probe microanalysis or inductively coupled plasma-mass spectroscopy, (3) scanning electron microscopy equipped with wavelength dispersive spectroscopy (WDS) and/or energy dispersive spectroscopy (EDS), (4) transmission electron microscopy equipped with WDS and/or EDS and selected area electron diffraction, and (5) similar or better analytical techniques. 

Scanning electron microscopy (SEM) constitutes one of the older and one of the most widely used instruments for surface analysis. It provides a three-dimensional visual image and, thus, the quantitative analysis is relatively straightforward. 

Wortmann F J, Quantitative fiber mixture analysis by scanning electron microscopy. Part III Round trial results on mohair/wool blends , Textile Research Journal, 1991,61, 371-374. 

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