Photoelectron-induced diffraction

However, we have found that reaction induced restructuring of Bi2FeMo20]2 produces a narked enhancement in catalytic behavior (Table II . X-ray diffraction, in-situ Raman spectroscopy, and photoelectron spectroscopy reveal that the restructuring produces a multiphase system consisting of unreacted Bi FeMo20.2, in combination with Bi2MOj0.2, 0-FeHoO and a small amount of Bi2MoO. The key features of the Raman spectra of the activated catalyst are summarized in Table III. 

Laser-induced desorption via the DIET process is a structure-sensitive phenomenon. Firstly, we describe the recent results for adsorbed NO on Pt(l 1 1), since the adsorption structure of this system has been misunderstood for a long time. Adsorbed species giving rise to the 1490 cm-1 NO stretching vibrational mode had been believed to be adsorbed at bridge sites [34, 35]. Recently it has been shown that this species is adsorbed at the threefold fee hollow site. This problem was pointed at first using LEED analysis by Materer et al. [36, 37]. A similar problem is the occupation of the fee and hep threefold hollow sites in a ratio of 50/50 described by Lindsay et al. [38] on the basis of a photoelectron diffraction investigation of NO on Ni(l 1 1) at a coverage of 0.25 monolayer. 

The Ca, Sr and Fe contents were determined with a Seiko induced coupled plasma (ICP) spectrometer by first dissolving in HCl and PO was assayed by molybdenum blue method. The morphology of the particles was observed using a Joel electron microscope. X- ray powder diffraction (XRD) was done with a Rigaku high-intensity diffractometer using nickel-filtered Cu-Ko radiation (60 kV, 125 mV). X-ray photoelectron spectroscopy... 

X-ray induced Auger electron spectroscopy X-ray absorption near edge structure X-ray photoelectron spectroscopy X-ray diffraction X-ray fluorescence... 

Inductively Coupled Plasma. Mass Spectrometry Archaeological Applications. Microscopy Techniques Scanning Electron Microscopy. Surface Analysis X-Ray Photoelectron Spectroscopy Particle-Induced X-Ray Emission Auger Electron Spectroscopy. X-Ray Absorption and Diffraction X-Ray Diffraction - Powder. X-Ray Fluorescence and Emission X-Ray Fluorescence Theory. 

Impurity inclusions and surface defects are a cause of many difficulties to the polymer producer and user. Equipment used for studying these phenomena discussed in Chapter 4 include electron microprobe x-ray emission/spectroscopy, NMR micro-imaging, various forms of surface infrared spectroscopy, e.g., diffusion reflection FTIR, ATR, also photoacoustic spectroscopy and x-ray diffraction - infrared microscopy of individual polymer fibres. Newer techniques such as scanning electron microscopy (SECM), transmission electron microscopy, time of flight secondary ion mass spectrometry (TOFSIMS), laser induced photoelectron ionisation with laser desorption, atomic force microscopy and microthermal analysis are discussed. 

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