Near samples

Using a visible light probe NSOM is the eadiest of the probe scopes, at least in conception, and is another apparent exception to the diffraction-liinited resolution rule, in that NSOM illuminates an object with a beam of visible light smaller than the diffraction limit. The resolution then is limited only by the size of that beam. To achieve this, light issuing from a very tiny aperture at the end of a glass capillary scans a very near sample. The tip must be located on the order of X/2 from that surface. Resolution in the range of 10—20 nm has been achieved (31). 

The reduced oxidation near sample corners is related to these stress effects, either by retarded diffusion or modified interfacial reactionsManning described these stresses in terms of the conformational strain and distinguished between anion and cation diffusion, and concave and convex surfaces. He defined a radial vector M, describing the direction and extent of displacement of the oxide layer in order to remain in contact with the retreating metal surface, where ... 

In 4-5 45° ACWJ s, Jc(45°) was nearly sample independent and nonvanishing. [12] For these ACWJ s, they obtained Fraunhofer-like patterns and performed Shapiro step analyses, indicating that their junctions were weak and first order. They also found to be independent of... 

Figure 5a). Note that the scores in this factor space roughly describe a circle, with the exception of fraction 13, which is found near sample 10. Factor 3 (not shown) distinguishes sample 13 from the others with a component axis containing anthracene/phenanthrene moieties as well as an ion series at m/z 180, 194, 208. Chemical identification of the various ion series is tentative.

The CMR data showed a variable 142 ppm at 300 consistent with an assignment of an indane bridgehead carbon (literature value 143.9 in CHCI3). A component axis at 80 (mass spectral data only) near sample 13 showed peaks characteristic of alkyl anthracene/ phenanthrenes. The original CMR factor analysis showed correlated... 

The first evidence for radioactivity occurred when photographic films were exposed when placed near samples of uranium, (a) True,... 

Fig. 9.3 The sectional view of HiPP with two-dimensional detector system of HiPP. The bottom left insert shows the angle resolved mode while the bottom right inset shows one-dimensional spatially resolved mode. (Inset The geometric configuration near sample surface and first nozzle.) Reproduced from ref [30]...

Fig. 9.4 Gas dynamic simulation based on Monte Carlo methods displays the efficient performance of differential pumping near pre-lens elements, (a) Calculated pressure distribution across the pre-lens system. (Po = pressure region in sample, Pi 2 3 = pressure region in each differential pumping regions.) (b) Calculated pressure distribution near sample surface and first pre-lens system. Reproduced from ref [29]...

Fluid samples may be collected downhole at near-reservoir conditions, or at surface. Subsurface samples are more expensive to collect, since they require downhole sampling tools, but are more likely to capture a representative sample, since they are targeted at collecting a single phase fluid. A surface sample is inevitably a two phase sample which requires recombining to recreate the reservoir fluid. Both sampling techniques face the same problem of trying to capture a representative sample (i.e. the correct proportion of gas to oil) when the pressure falls below the bubble point. 

In traditional Fan-Beam CT the radiation emitted from the X-ray tube is collimated to a planar fan, and so most of the intensity is wasted in the collimator blades (Fig. 2a). Cone-Beam CT, where the X-rays not only diverge in the horizontal, but also in the vertical direction, allows to use nearly the whole emitted beam-profile and so makes best use of the available LINAC photon flux (Fig. 2b). So fast scanning of the samples three-dimensional structure is possible. For Cone-Beam 3D-reconstruction special algorithms, taking in consideration the vertical beam divergence of the rays, were developed. 

Because of the large thickness x-rayed by high-current betatron (more than 1500 ram on plastic) the picture of defect situated near the front wall of the sample is too increased what makes difficult to detect in practice real dimensions of the defect. But there is a possibility of stereosurvey due to existence of two radiation beams simultaneously generated by betatron. 

The physics of X-ray refraction are analogous to the well known refraction of light by optical lenses and prisms, governed by Snell s law. The special feature is the deflection at very small angles of few minutes of arc, as the refractive index of X-rays in matter is nearly one. Due to the density differences at inner surfaces most of the incident X-rays are deflected [1]. As the scattered intensity of refraction is proportional to the specific surface of a sample, a reference standard gives a quantitative measure for analytical determinations. 

This paper deals with the control of weld depth penetration for cylinders in gold-nickel alloy and tantalum. After introducing the experimental set-up and the samples description, the study and the optimization of the testing are presented for single-sided measurements either in a pulse-echo configuration or when the pump and the probe laser beams are shifted (influence of a thermal phenomenon), and for different kind of laser impact (a line or a circular spot). First, the ultrasonic system is used to detect and to size a flat bottom hole in an aluminium plate. Indeed, when the width of the hole is reduced, its shape is nearly similar to the one of a slot. Then, the optimization is accomplished for... 

NSOM Near-Held scanning optical microscopy [103a] Light from a sharp tip scatters off sample Surface structure to 3 nm... 

Most fiindamental surface science investigations employ single-crystal samples cut along a low-index plane. The single-crystal surface is prepared to be nearly atomically flat. The surface may also be modified in vacuum. For example, it may be exposed to a gas that adsorbs (sticks) to the surface, or a film can be grown onto a sample by evaporation of material. In addition to single-crystal surfaces, many researchers have investigated vicinal, i.e. stepped, surfaces as well as the surfaces of polycrystalline and disordered materials. 

Photoelectron spectroscopy provides a direct measure of the filled density of states of a solid. The kinetic energy distribution of the electrons that are emitted via the photoelectric effect when a sample is exposed to a monocluomatic ultraviolet (UV) or x-ray beam yields a photoelectron spectrum. Photoelectron spectroscopy not only provides the atomic composition, but also infonnation conceming the chemical enviromnent of the atoms in the near-surface region. Thus, it is probably the most popular and usefiil surface analysis teclmique. There are a number of fonus of photoelectron spectroscopy in conuuon use. 

X-ray photoelectron spectroscopy (XPS), also called electron spectroscopy for chemical analysis (ESCA), is described in section Bl.25,2.1. The most connnonly employed x-rays are the Mg Ka (1253.6 eV) and the A1 Ka (1486.6 eV) lines, which are produced from a standard x-ray tube. Peaks are seen in XPS spectra that correspond to the bound core-level electrons in the material. The intensity of each peak is proportional to the abundance of the emitting atoms in the near-surface region, while the precise binding energy of each peak depends on the chemical oxidation state and local enviromnent of the emitting atoms. The Perkin-Elmer XPS handbook contains sample spectra of each element and bindmg energies for certain compounds [58]. 

It should be noted that this technique is not without some disadvantages. The blackbody emission background in the near IR limits the upper temperature of the sample to about 200°C [43]. Then there is the dependence of the Raman cross-section ( equation (B 1.3.16) and equation ( B1.3.20)-equation ( B 1.3.21)) which calls for an order of magnitude greater excitation intensity when exciting in the near-IR rather than in the visible to produce the same signal intensity [39]. 

This corresponds to the physician s stethoscope case mentioned above, and has been realized [208] by bringing one leg of a resonatmg 33 kHz quartz tiinmg fork close to the surface of a sample, which is being rastered in the x-y plane. As the fork-leg nears the sample, the fork s resonant frequency and therefore its amplitude is changed by interaction with the surface. Since the behaviour of the system appears to be dependent on the gas pressure, it may be assumed that the coupling is due to hydrodynamic mteractions within the fork-air-sample gap. Since the fork tip-sample distance is approximately 200 pm -1.120), tire teclmique is sensitive to the near-field component of the scattered acoustic signal. 1 pm lateral and 10 mn vertical resolutions have been obtained by the SNAM. 

This method relies on the simple principle that the flow of ions into an electrolyte-filled micropipette as it nears a surface is dependent on the distance between the sample and the mouth of the pipette [211] (figure B 1.19.40). The probe height can then be used to maintain a constant current flow (of ions) into the micropipette, and the technique fiinctions as a non-contact imaging method. Alternatively, the height can be held constant and the measured ion current used to generate the image. This latter approach has, for example, been used to probe ion flows tlirough chaimels in membranes. The lateral resolution obtainable by this method depends on the diameter of the micropipette. Values of 200 nm have been reported. 

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