Near field scanning electron microscopy

Nc.ar-Fi ld Scanning Optical Microscope.. The near-field scanning optical microscope (NSOM) should, strictiy speaking, be NSLM for near-field scanning light microscopy because "optical" includes electron optical as well as light optical and NSOM is a light microscope. 

Near-field scanning optical microscopy (NSOM) allows an extension of optical microscopy to near that of electron microscopy. The central feature is the optical element that is similar. 

NSOM Near-Field Scanning Optical Microscopy Scanning Electron Microscopy (SEM)... 

Microscopic techniques, 70 428 Microscopists, role of, 76 467 Microscopy, 76 464-509, See also Atomic force microscopy (AFM) Electron microscopy Light microscopy Microscopes Scanning electron microscopy (SEM) Transmission electron microscopy (TEM) acronyms related to, 76 506-507 atomic force, 76 499-501 atom probe, 76 503 cathodoluminescence, 76 484 confocal, 76 483-484 electron, 76 487-495 in examining trace evidence, 72 99 field emission, 76 503 field ion, 76 503 fluorescence, 76 483 near-held scanning optical,... 

For nearly two hundred year s microscopy as a science depended on the use of visible and, rarely, near UV electromagnetic radiation. In the early part of this century developments in theoretical Physics opened other avenues of seeing objects. The following is not an exhaustive list but does illustrate the expansion in the science of microscopy which began earlier this century and which continues today. First came the use of electrons in the forms of transmission and scanning electron microscopies [TEM and SEM 3,4]. Then, relatively recently, came the use of sound as an imaging medium in the development of acoustic microscopy [5,6]. Most recently, near-field optical microscopy [7] and the family of scanning probe microscopies have been developed [8]. 

Transmission electron microscopy (TEM) has traditionally been the mainstay of morphological investigations of polyolefins [8], but recent developments in low voltage high-resolution field emission gun scanning electron microscopy (FEG-SEM) [9] and the advent of atomic force microscopy (AFM) and related near-field techniques [10] have challenged its dominance at the length scales of the order of 10 nm, characteristic of both microdeformation (cavitation, fibrils) and structural components of semicrystalline... 

Fujii et al. [13] studied morphological structures of the cross section of various hollow fibers and fiat sheet membranes by high-resolution field emission scanning electron microscopy. Figure 6.8 shows a cross-sectional structure of a flat sheet cellulose acetate RO membrane. The layer near the top surface is composed of a densely packed monolayer of polymeric spheres, which is supported by a layer formed with completely packed spheres. The contours of the spheres in the top layer can be observed. The middle layer is also composed of loosely packed and partly fused spheres, which are larger than the spheres in the surface layer. In the middle layer, there are many microvoids, the sizes of which are the same as the spheres. The layer near the bottom is denser than the middle layer, and the spheres are deformed and fused. Interstitial void spaces between the spheres, which may be called microvoids, are clearly observed. This structure seems common for the flat sheet as well as the hollow fiber membranes. For example. Fig. 6.9 shows a cross section of a hollow fiber made of PMMA B-2 (a copolymer containing methyl methacrylate and a small amount of sulfonate groups). The inside surface layer is composed of the dense structure of compactly packed fine polymeric particles. The particle structure of the middle layer... 

SD spinodal decomposition SEM scanning electron microscopy SNOM scanning near-field optical microscopy STED stimulated emission depletion SWNT single wall carbon nanotube TEM transmission electron microscopy... 

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