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Near field optical microscopy

Whereas, near-field microscopy achieves a high resolution by illuminating a nanometric area with localized light around a small probe tip, the super-resolution techniques extract nanometer-scale information from optical images captured using conventional lens-based optics. Among several super-resolution techniques that have been reported, stimulated emission depletion (STED) microscopy [43-45] and [Pg.617]


B1.19.4 SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND OTHER SPMS... [Pg.1715]

Of the methods described in this section, scaiming near-field optical microscopy (SNOM or NSOM) is tlie closest to being able to provide useful infonuation that is unobtainable by other means. Indeed, this teclmique has already been made available as a conunercial instmment. A detailed review of SNOM has been written by Pohl 11931. [Pg.1715]

Durig U T, Pohl D W and Rohner F 1986 Near-field optical-scanning microscopy J. Appl. Phys. 59 3318 Pohl D W 1991 Scanning near-field optical microscopy (SNOM)/Icfr/. Opt. Electron. Microsc. 12 243... [Pg.1730]

Takahashi S, Futamata M and Ko]ima I 1999 Spectroscopy with scanning near-field optical microscopy using photon tunnelling mode J. Microscopy 194 519... [Pg.1730]

Ambrose W P, Goodwin P M, Martin J C and Keller R A 1994 Alterations of single-molecule fluorescence lifetimes in near-field optical microscopy Science 265 364-7... [Pg.2505]

More recently, the method of scanning near-field optical microscopy (SNOM) has been applied to LB films of phospholipids and has revealed submicron-domain structures [55-59]. The method involves scanning a fiber-optic tip over a surface in much the same way an AFM tip is scanned over a surface. In principle, other optical experiments could be combined with the SNOM, snch as resonance energy transfer, time-resolved flnorescence, and surface plasmon resonance. It is likely that spectroscopic investigation of snbmicron domains in LB films nsing these principles will be pnrsned extensively. [Pg.67]

Near-Field Optical Microscopy Using a Metallic Nano-Tip... [Pg.22]

Eischer, U. Ch. and Pohl, D. W. (1989) Observation of single-particle plasmons by near-field optical microscopy. Phys. Rev. Lett., 62, 458-461. [Pg.36]

Nagahara, T., Imura, K. and Okamoto, H. (2004) Time-resolved scanning near-field optical microscopy with supercontinuum light pulses generated in microstructure fiber. Rev. Sci. Instrum., 75, 4528-4533. [Pg.52]

Nechay, B.A., Siegner, U.,Achermann, M., Bielefeldt, H. and Keller, U. (1999) Femtosecond pump-probe near-field optical microscopy. Rev. Sci. Instrum., 70, 2758-2764. [Pg.53]

Imura, K and Okamoto, H. (2006) Redprodty in scanning near-field optical microscopy illumination and collection modes of transmission measurements. Opt. Lett., 31, 1474-1476. [Pg.53]

Aoki, H., Anryu, M. and Ito, S. (2005) Two-dimensional polymers investigated by scanning near-field optical microscopy conformation of single polymer chain in monolayer. Polymer, 46, 5896-5902. [Pg.69]

Aoki, H., Tanaka, S Ito, S. and Yamamoto, M. (2000) Nanometric inhomogeneity of polymer network investigated by scanning near-field optical microscopy. Macromolecules, 33, 9650-9656. [Pg.69]

Scanning Near-field Optical Microscopy (SNOM)... [Pg.33]

SNOM Scanning near-field optical microscopy (see NSOM)... [Pg.760]

Surface properties are important to the physical and chemical behavior of polymers. Similar to smaller molecules, polymer surface structures can be determined using a variety of techniques including AES, near-field optical microscopy, electron microscopy, SPM, SIMS, and certain IR and MS procedures. [Pg.455]

Mechanistic investigations of gas-solid and solid-solid reactions as well as their proper engineering require identifiable crystal surfaces for atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) [1,3, 13-15] in combination with X-ray diffraction data, which are the basis of crystal packing analyses [1,3,16-18]. [Pg.101]

Hecht, B., Bielefeldt, H., Inouye, Y, Pohl, D. W., and Novotny, L. 1997. Facts and artifacts in near-field optical microscopy. J. Appl. Phys. 81 2492-98. [Pg.268]


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