Multilayer film element

Curme, H.G., Columbus, R.L., Dappen, G.M. et al. (1978). Multilayer film elements for clinical analysis general concepts. Clin. Chem. 24, 1335-1342. 

Takai, T., Kohno, M., Sakamoto, Y., Iwamoto, Y. and Matsuda, F. (1984). Clinical application of Fuji Drichem-IOOO glucose analyzer using multilayer-film elements. Hormon to Rinsho 32, 477-481. 

E401 Van Brunt, N., Day, B., Downs, D., Roth, J., Smith, T., Kissel, T.R., Daniel, D.S. and Toner, J. (1987). Performance of a new improved ionophore with better Na selectivity in a multilayered film element. Clin. Chem. 33, 1005, Abstr. 609. 

Cur me HG, Columbus RL, Dappen GM, Elder TW, Fellow WD, Figueras J et al. Multilayer film elements for clinical analysis General concepts. Chn Chem 1978 24 1335-42. 

Figure 10.8. Multilayer film elements for determination of urea in blood as an example of an old ju-TAS (left). Evaluation by means of a reflection photometer (right)...

To present briefly the different possible scenarios for the growth of multilayer films on a homogeneous surface, it is very convenient to use a simple lattice gas model language [168]. Assuming that the surface is a two-dimensional square lattice of sites and that also the entire space above the surface is divided into small elements, forming a cubic lattice such that each of the cells can be occupied by one adsorbate particle at the most, the Hamiltonian of the system can be written as [168,169]... 

Molecular calculations provide approaches to supramolecular structure and to the dynamics of self-assembly by extending atomic-molecular physics. Alternatively, the tools of finite element analysis can be used to approach the simulation of self-assembled film properties. The voxel4 size in finite element analysis needs be small compared to significant variation in structure-property relationships for self-assembled structures, this implies use of voxels of nanometer dimensions. However, the continuum constitutive relationships utilized for macroscopic-system calculations will be difficult to extend at this scale because nanostructure properties are expected to differ from microstructural properties. In addition, in structures with a high density of boundaries (such as thin multilayer films), poorly understood boundary conditions may contribute to inaccuracies. 

A significant property of the multilayer films, namely the structural independence of adjacent layers, was revealed. This property showed up as an offset of structural elements and grain boundaries between layers. Therefore, it was possible to control structure-sensitive parameters of the solid-electrolyte films. 

The elemental analysis of multilayer films (50 layers) of polyamic acid salt and polyimide 5a was performed by ESCA (electron spectroscopy for chemical analysis), with the following results ... 

Dl Kamei, S., Ohkubo, A. and Yamanaka, M. (1981). Multilayer-film analytical element for the determination of glucose in plasma and serum. Rinsho-Byori 29, 713-716. 

D3 Ohkubo, A., Kamei, S., Yamanaka, M., Arai, F., Kitajima, M. and Kondo, A. (1981). Plasma glucose concentration of whole blood, as determined with a multilayer-film analytical element. Clin. Chem. 27, 1287-1290. 

E282 Ratge, D., Kohse, K.P., Knoll, E. and Wisser, H. (1986). Evaluation of the multilayer technique using thin-film elements for analysis of electrolytes, substrates and enzymes. Poster presented at Gemeinsame Jahrestagung der Deutschen, Schweizerischen, Osterreichischen und Franzosischen Gesellschaft fiir Klinische Chemie, Basel, 22-25 October. 

In 1979, White [3.2] observed that, by milling elemental Nb and Sn powders, the distinct X-ray diffraction peaks of the elements disappeared and typical diffuse peaks of an amorphous pattern showed up. But these samples did not show the superconducting transition temperature of vapor-quenched amorphous Nb-Sn alloys. In 1983, Koch et al. reported on the Preparation of amorphous Ni60Nb40 by mechanical alloying [3.3]. After the detection of amorphization by solid-state reaction in evaporated multilayer films by Schwarz and Johnson [3.4] (see also Chap. 2), Schwarz et al. [3.5] proposed after investigating glass formation in Ni-Ti alloys, that amorphization by mechanical alloying is also based on the solid-state reaction process. Within the last couple... 

Upon X-ray exposure of a NPPTMS multilayer film (Mg K emitting at 1253.6 eV operated at 15 kV and 20 pA), X-ray photoelectron spectroscopy (XPS) elemental composition data suggested chemical modification of nitro groups to primary amine functions. The N (Is) XPS profile of NPPTMS SAMs as a function of irradiation time is shown in Fig. lb. It can be observed that the pristine peak with a binding energy at 405.6 eV, characteristic of the NO2 moiety [13], diminishes in intensity with elapsed time. Concomitantly, a new peak... 

In order to better discuss the role of surface chemistry in photography, it is useful to consider some of the basic features of photographic elements (paper, film, etc.) morphology, exposure and processing. As a start, consider a multilayer photographic element such as that pictured in Figure 5.1. The layer structure illustrated is typical of a simple colour print material, such as colour paper or colour movie print films. Such materials comprise many different types of layers (1), and each layer is prepared as a thin film coating. 

Figure 5.1. Generic multilayer photographic film element shown in cross-section, illustrating the key morphological components overcoats, emulsion layers, subbing layer, support and antistat layer. The layer thicknesses are not drawn proportionately to scale. A typical emulsion layer may be 3-6 pm thick, a typical overcoat or interlayer may be 1-2 pm thick, and the support is typically of the order of 100 pm in thickness...

The motivation for this study was interface movement in the coextrusion of multilayer films. Figure 10.16 shows the computed and experimental deformation of the interface for flow of a low-density polyethylene (Dow 6411) through the same 61-cm channel. Here, only two layers were used. A three-dimensional finite element... 

Mitsoulis, E. (2005) Multilayer film coextmsion of polymer melts analysis of industrial lines with the finite element method. J. Polym. Eng., 25, 393-410. 

XRD offers unparalleled accuracy in the measurement of atomic spacings and is the technique of choice for determining strain states in thin films. XRD is noncontact and nondestructive, which makes it ideal for in situ studies. The intensities measured with XRD can provide quantitative, accurate information on the atomic arrangements at interfaces (e.g., in multilayers). Materials composed of any element can be successfully studied with XRD, but XRD is most sensitive to high-Z elements, since the diffracted intensity from these is much lar r than from low-Z elements. As a consequence, the sensitivity of XRD depends on the material of interest. With lab-based equipment, surface sensitivities down to a thickness of -50 A are achievable, but synchrotron radiation (because of its higher intensity)... 

Interdiffusion of bilayered thin films also can be measured with XRD. The diffraction pattern initially consists of two peaks from the pure layers and after annealing, the diffracted intensity between these peaks grows because of interdiffusion of the layers. An analysis of this intensity yields the concentration profile, which enables a calculation of diffusion coefficients, and diffusion coefficients cm /s are readily measured. With the use of multilayered specimens, extremely small diffusion coefficients (-10 cm /s) can be measured with XRD. Alternative methods of measuring concentration profiles and diffusion coefficients include depth profiling (which suffers from artifacts), RBS (which can not resolve adjacent elements in the periodic table), and radiotracer methods (which are difficult). For XRD (except for multilayered specimens), there must be a unique relationship between composition and the d-spacings in the initial films and any solid solutions or compounds that form this permits calculation of the compo-... 

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