Material images

Millbillillie regolith breccia, in plane-polarized light, 2 cm across. Clasts of basaltic eucrite are visible in a crushed matrix, crosscut by a vein of shock-melted material. Image from Lauretta and Killgore (2005), with permission. 

Bennett RA, Stone P, Bowker M (1999) Pd nanoparticle enhanced re-oxidation of HOj support material imaging of spillover and a new form of SMSI. Catal Lett 59 99... 

The image illustrates two important features of materials imaging. First, novel contrast features can be exploited to locate previously unknown material heterogeneities. 

Equipment typical for use in material imaging is depicted in Fig. 1.1.8. It consists of a solid-state NMR spectrometer console, a high-field wide-bore magnet (4—I4 l ), high-power rf amplifiers (/ = I kW) for H and for other nuclei, also called X nuclei, three gradient amplifiers, one for each space direction, and an rf receiver. One computer... 

There are basically three variations of the SIMS experiment. Static SIM.S is used for elemental analysis of sub-monolayers on surfaces. Although SIMS is basically a destructive technique, static conditions maintain the surface integrity during the lime scale of the experiment. Dynamic SIMS is used to obtain compositional information as a function of depth below the surface, nic dynamic SIMS experiment takes advantage of the destructive nature of SIMS to oblain information on various layers of materials. Imaging SIMS. also called scanning SIMS, is used to provide spatial images of surfaces. 

In accordance with Libera and Egerton [94], TEM is a powerful method with which to provide information within the synthesis-structure-property paradigm of materials science and engineering. However, for soft materials, image contrast generation and beam damage can be a challenge. 

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Materials imaging is not a highly developed technique, partly because of some of the difficulties inherent in attempting to view the small to microscopic features in solids [70-72]. Simply put, observation of microscopic structures requires very steep field gradients that are hard to generate. 

D.G. Sikharulidze and G.S. Chilaya, Preobrazovateli Izobrazheniya Tipa MDP—Elektroopticheskii Material Image Transducers Based on MIS-Electrooptical Material Structures). Moscow, Radio i Svyaz , 1986 (in Russian). 

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