Low-energy electrons

LEED See low energy electron dilTraction. lei See chelate effect, iepargylic acid See azeleic acid. 

The diffraction pattern consists of a small number of spots whose symmetry of arrangement is that of the surface grid of atoms (see Fig. IV-10). The pattern is due primarily to the first layer of atoms because of the small penetrating power of the low-energy electrons (or, in HEED, because of the grazing angle of incidence used) there may, however, be weak indications of scattering from a second or third layer. 

LEED Low-energy electron diffraction [62, 75, 105] Elastic backscattering of electrons (10-200 eV) Surface structure... 

The technique of low-energy electron diffraction, LEED (Section VIII-2D), has provided a considerable amount of information about the manner in which a chemisorbed layer rearranges itself. Somotjai [13] has summarized LEED results for a number of systems. Some examples are collected in Fig. XVlII-1. Figure XVIII-la shows how N atoms are arranged on a Fe(KX)) surface [14] (relevant to ammonia synthesis) even H atoms may be located, as in Fig. XVIII-Ih [15]. Figure XVIII-Ic illustrates how the structure of the adsorbed layer, or adlayer, can vary wiA exposure [16].f There may be a series of structures, as with NO on Ru(lOTO) [17] and HCl on Cu(llO) [18]. Surface structures of... 

G. Ertl and J. Kuppers, Low Energy Electrons and Surface Chemistry, Verlag Chemie, Berlin, 1985. 

It has also been shown that sufiBcient surface self-diflfiision can occur so that entire step edges move in a concerted maimer. Although it does not achieve atomic resolution, the low-energy electron microscopy (LEEM) technique allows for the observation of the movement of step edges in real time [H]. LEEM has also been usefiil for studies of epitaxial growth and surface modifications due to chemical reactions. 

Electrons are extremely usefiil as surface probes because the distances that they travel within a solid before scattering are rather short. This implies that any electrons that are created deep within a sample do not escape into vacuum. Any technique that relies on measurements of low-energy electrons emitted from a solid therefore provides infonuation from just the outenuost few atomic layers. Because of this inlierent surface sensitivity, the various electron spectroscopies are probably the most usefid and popular teclmiques in surface science. 

Another mode of electron diffraction, low energy electron diffraction or FEED [13], uses incident beams of electrons with energies below about 100 eV, with corresponding wavelengths of the order of 1 A. Because of the very strong interactions between the incident electrons and tlie atoms in tlie crystal, there is very little penetration of the electron waves into the crystal, so that the diffraction pattern is detemiined entirely by the... 

We will, in the latter part of this discussion, focus only on those few methods that have been the most productive, with low-energy electron diffraction (FEED) receiving the most attention. Indeed, LEED has been the most successfiil surface stmctiiral method in two quite distinct ways. First, LEED has become an almost universal characterization... 

The diffraction of low-energy electrons (and any other particles, like x-rays and neutrons) is governed by the translational syimnetry of the surface, i.e. the surface lattice. In particular, the directions of emergence of the diffracted beams are detemiined by conservation of the linear momentum parallel to the surface, bk,. Here k... 

Pendry J B 1974 Low-Energy Electron Diffraction (London Academic)... 

Rous P J 1993 A global approach to the search problem in surface crystallography by low-energy electron diffraction Surf. Sc 296 358-73... 

EELS Electron energy loss spectroscopy The loss of energy of low-energy electrons due to excitation of lattice vibrations. Molecular vibrations, reaction mechanism... 

D) LOW-ENERGY ELECTRON BEAM (RETARDING-POTENTIAL) METHODS... 

A low-energy electron beam can also be obtained using a field emission tip and used in the field emission retarding-potential method. This combination provides an absolute measure of the sample work fiinction and the resolution is excellent [52]. 

Gillis H P, Choutov D A, Steiner P A IV, Piper J D, Crouch J H, Dove P M and Martin K P 1995 Low energy electron enhanced etching of Si(IOO) in hydrogen-helium DC plasma App/. Phys. Lett. 66 2475-7... 

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