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Low-energy electron microscope LEEM

The past decade saw introduction of the low-energy electron microscope (LEEM) (12). It was expected potentially to be capable of moderately high resolution (6-mn) video-rate imaging of surfaces and interfaces. This would make it capable of studying dynamic processes at surfaces, thin-fibn growth, strain relief, etching, absorption. [Pg.244]

See other pages where Low-energy electron microscope LEEM is mentioned: [Pg.163]    [Pg.3071]    [Pg.204]    [Pg.94]    [Pg.547]    [Pg.70]    [Pg.163]    [Pg.3071]    [Pg.204]    [Pg.94]    [Pg.547]    [Pg.70]    [Pg.195]    [Pg.210]    [Pg.195]    [Pg.156]    [Pg.83]    [Pg.349]   
See also in sourсe #XX -- [ Pg.94 ]

See also in sourсe #XX -- [ Pg.94 ]



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