Low-energy electron point source

Golzhauser et al. [29] studied the optimal conditions (electron energy, width of the electron beam, and the detector size) for low electron point source microscopy using holograms of phthalocyaninato polysiloxane (PcPS), a rodlike macromolecule. 

The statistical factors referred to above are by far the most significant sources of scintillation line broadening. Below 100 keV, the resolution is mainly determined by these uncertainties. (Compare this with semiconductor detectors where at low energy, electronic noise is usually the dominant factor - see Chapter 11.) The uncertainty is at its greatest at the point at which the number of information carriers is at a minimum, being mainly determined by the number of photoelectrons emitted by the photocathode. 

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