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Line profile simulation

CH2 = PH Estimates mH = 9Q 30) kHz, 10 kHz from line profile simulations values were scaled down from main isotopic species and held fixed). Spin-spin interaction constants were calculated and held fixed. [Pg.349]

FIG. 43. Measured and simulated thickness profiles on the substrate behind the slit for a film deposited under discharge conditions that typically yield good material properties (a) along the length of the slit, (b) across the slit. The vertical dashed-dotted lines indicate the boundaries of the apertures. The dotted lines represent the measured profiles, the solid lines the simulated profiles. The dashed lines are the simulated deposition profiles of the radicals. (From E. A. G. Hamers. Ph.D. Thesis, Universiteit Utrecht, Utrecht, the Netherlands, 1998. with permission.)... [Pg.117]

Figure 47, SAMPLE generated profile simulations in AZ1350J resist exposed at 436 nm on an index matched substrate. The mask edge is at 0.75um on the horizontal scale. The unbleachable optical absorbance (A) was varied from the actual value at 436 nm, 0.08 to 0.43. The dose was adjusted to develop each case to dimension (l.5um space) at constant development time. As A increases, all other factors being constant, the dose required to open the line increases and the resist profile becomes... Figure 47, SAMPLE generated profile simulations in AZ1350J resist exposed at 436 nm on an index matched substrate. The mask edge is at 0.75um on the horizontal scale. The unbleachable optical absorbance (A) was varied from the actual value at 436 nm, 0.08 to 0.43. The dose was adjusted to develop each case to dimension (l.5um space) at constant development time. As A increases, all other factors being constant, the dose required to open the line increases and the resist profile becomes...
Fig. 2 Schematic description of the free energy (solid line) and internal energy (dashed line) profiles of the interfacial water species. The energy differences are obtained from simulations. Fig. 2 Schematic description of the free energy (solid line) and internal energy (dashed line) profiles of the interfacial water species. The energy differences are obtained from simulations.
Figure 22. Variable-energy XPS data for Sb-doped Sn02 nanocrystals. (a) Ratio of Sb(III) 3) Sb(III) radial distribution profile, (c) Sb(V) radial distribution profile. [Adapted from... Figure 22. Variable-energy XPS data for Sb-doped Sn02 nanocrystals. (a) Ratio of Sb(III) 3</3/2 ( ) and Sb(V) 3 5/2 (°) to Sn A/3/2 versus photon energy. Solid lines are simulations, dotted lines are estimated error limits, and the dashed line represents the data predicted for the limit of isotropic doping. (/>) Sb(III) radial distribution profile, (c) Sb(V) radial distribution profile. [Adapted from...
Although interesting in its own right, the present study acquires additional strong motivation due to its direct applicability to highly accurate numerical simulations of (de)excitation and ionization probabilities as well as line profiles in various resonant multiphoton processes occurring with ns- /2-states in... [Pg.784]

The solid and dashed lines represent simulations for two individuals with significantly different profiles corresponding to different initial conditions, c (0) = 90/igml-1 (solid) and c(0) = 150/rgml-1 (dashed). Parameter values were set to... [Pg.339]

Figure 9. Simulation of a line profile for a 1.0 (im line/space pattern. The edge of the slit is at x 0. Profiles are shown for defocus values of 0, 1, and 2 jjLm. Figure 9. Simulation of a line profile for a 1.0 (im line/space pattern. The edge of the slit is at x 0. Profiles are shown for defocus values of 0, 1, and 2 jjLm.
In this paper we present a highly accurate ab initio theoretical study to simulate, under most general condition, ionization probabilities and line profiles for two-photon resonant excitation, a) 6), possibly followed by one-photon... [Pg.421]

Figure 5.4. A. satellite transition spectrum of crystalline mullite. B. Portion of the satellite transition spectrum of mullite, showing observed sideband spectrum (top), simulated spectrum (middle) and the one octahedral and three tetrahedral line profiles used in the simulation. After Rehak et al. (1998), by permission of the Mineralogical Society of America. Figure 5.4. A. satellite transition spectrum of crystalline mullite. B. Portion of the satellite transition spectrum of mullite, showing observed sideband spectrum (top), simulated spectrum (middle) and the one octahedral and three tetrahedral line profiles used in the simulation. After Rehak et al. (1998), by permission of the Mineralogical Society of America.
Figure 21. Experimental and simulated elution profiles for different sample compositions. The symbols are experimental data, the lines are simulated elution profiles using the competitive bi-Langmuir adsorption parameters determined by the PP method. Sample 20 pL 5.0 mM L-enantiomer and 5.0 mM D-enantiomer. Figure 21. Experimental and simulated elution profiles for different sample compositions. The symbols are experimental data, the lines are simulated elution profiles using the competitive bi-Langmuir adsorption parameters determined by the PP method. Sample 20 pL 5.0 mM L-enantiomer and 5.0 mM D-enantiomer.
Figure 9.10 Sensitivity of the simulated meteorological fields using the BEP module to urban parameters a) wind profile simulated with 40 m (black line) and 10 m (red fine) building height b) Temperature evolution inside the urban canopy for three different street heat capacities 1.4 (basecase), 14 (fine ), 0.14 (line ) MJm 3K 1 (EPFL contribution in Baklanov et al., 2005 [38]). Figure 9.10 Sensitivity of the simulated meteorological fields using the BEP module to urban parameters a) wind profile simulated with 40 m (black line) and 10 m (red fine) building height b) Temperature evolution inside the urban canopy for three different street heat capacities 1.4 (basecase), 14 (fine ), 0.14 (line ) MJm 3K 1 (EPFL contribution in Baklanov et al., 2005 [38]).
The main difference between the proposed method and the convolution approach (in which the line profile is synthesized by convolving the specific instrumental functions) lies in the fact that the former provides an exact solution for the total instrumental function (exact solutions for specific instrumental functions can be obtained as special cases), whereas the latter is based on the approximations for the specific instrumental functions, and their coupling effects after the convolution are unknown. Unlike the ray-tracing method, in the proposed method the diffracted rays contributing to the registered intensity are considered as combined (part of the diffracted cone) and, correspondingly, the contribution to the instrumental line profile is obtained analytically for this part of the diffracted cone and not for a diffracted unit ray as in ray-tracing simulations. [Pg.168]

Fig. 2.2. (a) STM image of small Au clusters on Ti02. Vacancies are marked with squares, (b) Simulated STM image of a single Au atom trapped in an oxygen vacancy, (c) Line profiles comparing DFT theoretical and experimental results. Reproduced from [34]. Copyright 2003 American Physical Society... [Pg.198]

Figure 1.16 Two indistinguishable compartmental models fit (solid lines) to the concentration-time profiles simulated under Model B in Fig. 1.13 (the reference model). Data were simulated using the reference model with unit bolus and volume of distribution equal to 1. The models were then fit to the simulated data. The analysis could not distinguish between the models. Figure 1.16 Two indistinguishable compartmental models fit (solid lines) to the concentration-time profiles simulated under Model B in Fig. 1.13 (the reference model). Data were simulated using the reference model with unit bolus and volume of distribution equal to 1. The models were then fit to the simulated data. The analysis could not distinguish between the models.
Fig. 48 Comparison of simulated and experimental profiles for pressure steps 0 to 5 mbar (a), 5 to 0 mbar (b), 0 to 10 mbar (c), 10 to 0 mbar (d), 0 to 40 mbar (e), 40 to 0 mbar (f), 0 to 80 mbar (g), and 80 to 0 mbar (h). Tbe points refer to experimental measurements. Tbe lines are simulated from tbe 2-D finite difference solution with the same concentration dependence of transport diffusivities as determined from Fig. 47 (full line) and the surface permeabilities determined from the use of Eqs. 7 and 8. For the simulations it is implied that Dz > Dy... Fig. 48 Comparison of simulated and experimental profiles for pressure steps 0 to 5 mbar (a), 5 to 0 mbar (b), 0 to 10 mbar (c), 10 to 0 mbar (d), 0 to 40 mbar (e), 40 to 0 mbar (f), 0 to 80 mbar (g), and 80 to 0 mbar (h). Tbe points refer to experimental measurements. Tbe lines are simulated from tbe 2-D finite difference solution with the same concentration dependence of transport diffusivities as determined from Fig. 47 (full line) and the surface permeabilities determined from the use of Eqs. 7 and 8. For the simulations it is implied that Dz > Dy...
FIGURE H.7 Simulated line profiles along the horizontal axis The change in shape of the line is due to the line going away from the focal position, which is here around pixel number 1100. [Pg.225]

Profiles comprise cross sections that are not a circle, annulus, or wide sheet. Like pipe and tubing lines, profile extrusion lines consist of an extruder, profile die, calibration device, cooling system, puller, and a cut-off saw and stacker or wind-up unit. The main differences are the dies and calibration units. Due to lack of symmetry, obtaining a correct cross section in a profile die is difficult. Differential flow resistance in different parts of the cross section alters the flow rate for these parts of the die. In addition, die swell may vary due to the differences in flow. Consequently, the extrudate may bend as it exits the die. To equalize flow, the die land length is varied or restricting plates are used in channels where the flow is too rapid. Many profile dies are split into sections, with the die sliced perpendicular to the major axis. Thus, sections can be altered in the process of die development. Flow simulation software is particularly useful in profile die design. [Pg.386]

Figure 2.19 (a) Topographical and (b) current features on the surface of HOPG obtained from SECM-AFM, with the corresponding cross-sectional profile (c) and (d) along the line marked in (a) and (b), respectively. (e) Vertical deflection and (f) current response of the upper area of (a) and (b), and the numbers indicated are different support potentials, changing from the white line, (g) Simulation of SECM with a conical... [Pg.62]

Figure 18.5b shows the results of one experiment performed at 250 °C by feeding and removing the NH3 feed flow every 300 s for NO2/NOX = 0.25 feed ratio the figure compares the measured (thin lines) and simulated (thick lines) outlet concentration profiles of NH3, NO and NO2 during such tests [6]. It can be noticed that a clear maximum in the DeNOx activity was still present at NH3 feed as already observed on the powdered catalyst. Notably, the simulation obtained by the dual site kinetic model showed the same qualitative behavior. [Pg.567]

Figure 1.4 Ionic density profiles for 1 1 electrolyte (restricted primitive model) near a charged hard wall. Bulk concentration of 1 mol and a = 0.7. The theoretical results are shown by solid line, while simulation results are shown as circles (co-ions) and triangles (counter ions). Figure 1.4 Ionic density profiles for 1 1 electrolyte (restricted primitive model) near a charged hard wall. Bulk concentration of 1 mol and a = 0.7. The theoretical results are shown by solid line, while simulation results are shown as circles (co-ions) and triangles (counter ions).
Figure 3.10 Comparison of normalized steady-state concentration profiles simulated at = 0.5 for IL (solid lines) and LL (circles) systems. The concentration gradi-... Figure 3.10 Comparison of normalized steady-state concentration profiles simulated at = 0.5 for IL (solid lines) and LL (circles) systems. The concentration gradi-...

See other pages where Line profile simulation is mentioned: [Pg.138]    [Pg.55]    [Pg.353]    [Pg.213]    [Pg.333]    [Pg.310]    [Pg.123]    [Pg.764]    [Pg.421]    [Pg.125]    [Pg.301]    [Pg.590]    [Pg.130]    [Pg.223]    [Pg.311]    [Pg.130]    [Pg.138]    [Pg.225]    [Pg.87]    [Pg.2154]    [Pg.98]    [Pg.86]    [Pg.86]    [Pg.22]   
See also in sourсe #XX -- [ Pg.301 , Pg.302 ]




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Simulated profile

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