LCR meter

Inductors—be aware that many vendors put cryptic markings such as 102 or 103 on them. For capacitors, there are industry standard markings. For example, 221 is 22 x 1 O pf, 222 is 22 x 102pf, and so on. All are referred to the base unit, pF. But in inductors, 102 may be 10 x 102in nH or pH. In other words they could be a factor of 1000 apart, with the same marking. If necessary, find an LCR meter and double-check. 

Can the dielectric constant (K) of BT with a particle size of less than 200 mn be increased As stated earher in the background section, the K values need to be higher for embedded capacitor apphcations. How does the tetragonality in terms of the c/a ratio of the BT unit cell relate to the K of the particles The K values of BT-08 powders treated chemically were measured for the test specimens of BT-08 powder consolidated by polyvinyl butyral (PVB) binder with silver electrodes and by being placed under a Hewlett-Packard LCR meter. Our preliminary... 

Measurements of the dielectric characteristics of samples of ice and ice particle aggregates were conducted with a LCR-meter (HIOKI, 3531). Most measurements were performed at frequencies between 50 Hz and 5 MHz and at temperatures between -15 °C and -0 °C. The basic accuracy of LCR meter is as being less than 2% in a frequency range of 100 Hz to 1 MHz, 3.5% below 100 Hz, and 7% above 1 MHz. 

For the measurements of the ferroelectric hysteresis of P(VDF-TrFE) via the flatband shift, we used capacitors with oxidised p-type (-lO cm ) silicon substrate (100-235 nm Si02) to prevent large amoimts of leakage current. The copolymer film was prepared as described above. We used films of thickness fiom 100 nm to 1 pm. The structiues were prepared in top electrode geometry , with thermal evaporated aluminium, patterned via a shadow mask. The measiuements of capacitance versus voltage (CV) were carried out with an Agilent 4284A LCR meter at a frequency of 1 MHz with sweep rates fiom... 

The electrical properties of the films were determined on aluminium/insu-lator/gold (MIM) structures. The capacitance was measured with a LCR Meter (Agilent 4284 A) at a frequency of 1 kHz. The specific resistance and the breakdown field strength were measured using a Source-Measure-Unit (SMU, Keithley 6430). The film thickness was determined by scanning electron microscopy (SEM). 

The LCR single program measures the dielectric properties of one sample cell as a function of the temperature and frequency. The HP4284A LCR meter measures at frequencies between 20 Hz. and 1 MHz. The LCR multiple program controlls an additional scanner which makes measurements on maximally five samples during one measuring scan possible. 

Dielectric measurements were performed in order to investigate the dynamics of the a-process of the stacked P2CS thin films listed in Table 2. An LCR meter (4284A, Agilent Technology, Santa Clara, CA) was used for the dielectric measurements. One measurement for the frequency/range from 20 Hz to 1 MHz... 

Immediately after production, a cylindrical glass container d = 25 mm h = S5 mm) containing the eleetrode was filled with 90 ml of the emulsion. The electrode was connected to a Hewlett-Packard 4263B LCR Meter operating at a frequency of 1 kHz, and the conductivity was measured every 60 s under constant-temperature conditions (25.0° 0.1 °C). The electrode was coated with gold to eliminate polarization effects and corrosion of the electrode material. 

The complex impedance of the surrogates was measured between 5 kHz and 1 MHz using a test bench, two metal electrodes, and an LCR meter (Agilent E4980A). A stamp ensured a constant contact pressure between electrodes and surrogate [8]. 

Another option to measure electrical impedance are inductance (L), capacitance (C), and resistance (R) (LCR) meters, typically using various bridge circuits, adjusting variable reference elements until a detector signal becomes nuU. Newer generations also make use of the more general I—V-measurement approach. These are very common... 

We evaluated a dielectric constant of layered fUms of PI NPs prepared. Capacitance, Cp, of films was measured by a LCR meter in air and at room temperature, and a dielectric constant, k, was calculated by the equation (2). 

Figure 3. Dielectric constant dependence on frequency for Epiclon-derived Pis. The e values at 1 kHz, 10 kHz and 100 kHz were experimentally obtained on a LCR METER, while those at 1 MHz were estimated by Maxwell s identity using ellipsometrical measurements...

Figure 2. Compared theoretical and measured spectra in PBS for both configurations (V c = 4 mV) with Agilent LCR meter E4980a.

Except for special cases, the Agilent E4890A LCR-Meter measures partial overloads when the SCS rotates, in particular above f j. But the overloads were also observed frequency independent at R = 100 kQ. These effects are probably originated in the limitations of the used LCR-Meter. 

We note that measurements in the range 10 to 10 Hz may be made quickly and with high precision using either a General Radio 1620-A or 1621 capacitance measuring assembly or a Hewlett Packard 4274-.A-multifrequency LCR meter. 

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