In-Situ Scanning Probe Microscopies Imaging and Beyond

Xiamen University, State Key Laboratory of Physical Chemistry of Solid Surfaces, China 

One of the most important tasks of modern electrochemistry is to develop microscopic pictures of solid-liquid interfaces and thus to provide a basis for the detailed understanding of electrochemical processes. To fulfill this task, the development of surface-specific and structure-sensitive in-situ methods to characterize electrochemical interfacial processes is indispensable. As early as 1970, Professor Martin Fleischmann was one of the pioneers in exploring in-situ methods that included surface-enhanced Raman spectroscopy [1], surface X-ray diffraction [2] and nuclear magnetic resonance [3] to characterize electrochemical interfaces. Nowadays, nontraditional electrochemical methods that include spectroscopic and microscopic as well as diffraction techniques have been extensively applied, and this has promoted an understanding of electrochemical interfaces at both atomic and molecular levels. 

Developments in Electrochemistry Science Inspired by Martin Fleischmann, First Edition. Edited by Derek Fletcher, Zhong-Qun Tian and David E. WilUams. 

In this chapter, attention is focused on in-situ STM and AFM, and recent advances of in-situ SPM in surface electrochemistry and nanoelectrochemistry are introduced, with applications that include surface characterization, nanostructuring, and molecular electronics. First, a brief discussion of the principles and features of STM and AFM is provided, and this is followed by some selected examples of the capabilities of both techniques in the study of surface and nanoelectrochemistry, mostly acquired in recent studies conducted by the present author s group. Emphasis is placed on the roles of in-situ STM and AFM from a methodological point of view. Finally, the prospects for the further development of in-situ SPM are reviewed. 

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In-Situ Scanning Probe Microscopies Imaging and Beyond... 

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