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Hydrogen electronic devices

The tetrahedrally bonded materials, such as Si and Ge, possess only positional disorder however, materials of this type exhibit high density of defect states (DOS). It is only with the addition of elements such as hydrogen and/or a halogen, typically fluorine, that the DOS is reduced to a point such that electronic device appHcations emerge. These materials contain up to - 10 atomic % hydrogen, commonly called hydrogenated amorphous siHcon (i -Si H). [Pg.357]

The next step is the hydrogen reduction of the trichlorosilane (Reaction 2 above). The end product is a poly crystalline silicon rod up to 200 mm in diameter and several meters in length. The resulting EGS material is extremely pure with less than 2 ppm of carbon and only a few ppb of boron and residual donors. The Czochralski pulling technique is used to prepare large single crystals of silicon, which are subsequently sliced into wafers for use in electronic devices.1 1... [Pg.223]

In recent years further concepts have been developed for the construction of polymer-based diodes, requiring either two conjugated polymers (PA and poly(A-methyl-pyrrole) 2 > or poly(A-methylpyrrole in a p-type silicon wafer solid-state field-effect transistor By modifying the transistor switching, these electronic devices can also be employed as pH-sensitive chemical sensors or as hydrogen or oxygen sensors 221) in aqueous solutions. Recently a PPy alcohol sensor has also been reported 222). [Pg.34]

The authors developed a multi-layered microreactor system with a methanol reforma- to supply hydrogen for a small proton exchange membrane fiiel cell (PEMFC) to be used as a power source for portable electronic devices [6]. The microreactor consists of four units (a methanol reformer with catalytic combustor, a carbon monoxide remover, and two vaporizers), and was designed using thermal simulations to establish the rppropriate temperature distribution for each reaction, as shown in Fig. 3. [Pg.67]

PS1 The PS 1-prep, introduced in this communication is the first reported with a polyhistidine tag fused to the N-terminus of the PsaF subunit. This construct was possible due to the fact that cyanobacterial PsaF-deletion mutants show no impact on photoautotrophic growth - in contrast to Chlamydomonas reinhardtii, where inactivation of PsaF results in a severe reduction of electron transfer from plastocyanin to PS 1 [Hippier et al. 1997], Also, the N-terminus of the F-subunit which was decorated by the tag is located towards the lumen side which enables an attachment of the isolated PS1 with the lumen-exposed /donor-side to the electrode surface in our hydrogen-producing device. [Pg.177]

Figure 6. Model of the hydrogen producing device, illustrating location and orientation of His-tagged PS1 and FS2 as engineered in this report as part of the semiartificial electron transport chain for the production of hydrogen from water. Figure 6. Model of the hydrogen producing device, illustrating location and orientation of His-tagged PS1 and FS2 as engineered in this report as part of the semiartificial electron transport chain for the production of hydrogen from water.
Researchers at Lehigh University are developing a methanol reforming silicon reactor with a palladium membrane for a hydrogen purification system built using semiconductor fabrication techniques. The device is designed to produce hydrogen for fuel cells for portable electronic devices, such as laptop computers and cell phones. [Pg.539]

The hydrogen sensitivity of palladinm-oxide-semiconductor (Pd-MOS) strnctnres was first reported hy Lnndstrom et al. in 1975 [61]. A variety of devices can he nsed as field-effect chemical sensor devices (Fignre 2.6) and these are introdnced in this section. The simplest electronic devices are capacitors and Schottky diodes. SiC chemical gas sensors based on these devices have been under development for several years. Capacitor devices with a platinum catalytic layer were presented in 1992 [62], and Schottky diodes with palladium gates the same year [63]. In 1999 gas sensors based on FET devices were presented [64, 65]. There are also a few publications where p-n junctions have been tested as gas sensor devices [66, 67]. [Pg.38]

Another example of an industrially relevant CVD process is the production of tungsten (W) films on various substrates for (a) wear and corrosion protection and (b) diffusion barriers in electronic devices. One CVD method for depositing tungsten is through the reduction of WFs with hydrogen, which follows the overall reaction ... [Pg.271]

The specific application of a material generally determines the particular structure desired. For example, hydrogenated amorphous silicon is used for solar cells and some specialized electronic devices (10). Because of their higher carrier mobility (see Carrier Transport, Generation, and Recombination), single-crystalline elemental or compound semiconductors are used in the majority of electronic devices. Polycrystalline metal films and highly doped polycrystalline films of silicon are used for conductors and resistors in device applications. [Pg.18]


See other pages where Hydrogen electronic devices is mentioned: [Pg.385]    [Pg.136]    [Pg.423]    [Pg.17]    [Pg.114]    [Pg.115]    [Pg.838]    [Pg.125]    [Pg.204]    [Pg.653]    [Pg.657]    [Pg.659]    [Pg.366]    [Pg.261]    [Pg.28]    [Pg.409]    [Pg.483]    [Pg.429]    [Pg.487]    [Pg.38]    [Pg.178]    [Pg.409]    [Pg.554]    [Pg.213]    [Pg.17]    [Pg.18]    [Pg.26]    [Pg.599]    [Pg.548]    [Pg.136]    [Pg.7]    [Pg.702]    [Pg.308]    [Pg.472]    [Pg.437]    [Pg.2]    [Pg.2]    [Pg.173]   
See also in sourсe #XX -- [ Pg.442 ]




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