HVEM

FujitaH (ed) 1985 In situ Experiments with HVEM (Osaka Osaka University Press) Gabor D 1948 Nature 161 111 Gai P L 1981 Phil. Mag. 43(4) 841... 

Structural characterization LEED, HEED, RHEED, FIM, FEM, TED, XRD, HVEM, AEM, EXAFS, ISS, ion channeling, ESDIAD, UPS, electron channeling, SEXAFS, vibrational EELS, and Raman spectroscopy... 

Figure 22 The kinetic scheme used to describe the electromer (EC) emission (hvEm) excited with light (a) and resulting from volume recombination of statistically independent holes and electrons (b). The low-efficient processes are indicated by the crosses in bold.

Ishida, Y., Ishida, H., Kohra, K., Ichinose, H. (1980). Determination of the Burgers vector of a dislocation by weak-beam imaging in a HVEM. Phil. Mag., A42, 453-62. 

Finally, we are grateful to the staff (L.L. Funk, E.A. Ryan and S.T. Ockers) at the HVEM-Tandem Facility at Argonne National Laboratory where much of the ion irradiation and in situ TEM was completed. Without their skilled assistance, we could not have made much progress in our research program. 

Royer SM, Kinnamon JC. 1991. HVEM serial-section analysis of rabbit foliate taste buds J. Type III ceUs and their synapses. J Comp Neurol 306 49-72. 

Preparation of semithin sections (up to a few micrometers thick) by ultramicrotomy, and investigation of these sections in a 1000-kV, high-voltage electron microscope (HVEM) to reveal larger particles more precisely and, thus, the true particle-diameter distribution. 

Figure 3. Electron microscopic techniques used to study micromechanical processes in polymers (a) investigation of fracture surfaces by SEM (b) investigation by TEM of ultrathin sections prepared from deformed and selectively stained bulk material and (c) deformation of samples of different thicknesses (bulk, semithin, and ultrathin)9 using special tensile stages with SEM, HVEM, and TEM. The technique in (c) shows the possibility of conducting in situ deformation tests in the electron microscope.

Figure 4. Crazes originating at rubber particles, with some partly ending in the matrix (HVEM image). The deformation direction is horizontal.

Fig. 1.11. Through-focal series of UHR-HVEM images for a very thin part of YBa2Cu306.4, taken with the ineident beam parallel to [001] at an accelerating voltage of SOO kV. The defoeus value is 800 A (underfocus) (a), 450 A (b), 300 A (c), 50 A (d) and —300 A (e). (f) is the projected structure of the unit-eell. At the sites arrowed in (b) small but clear dark spots are visible, showing the sites of oxygen atom eolumns.

HIPS high-impact polystyrene HVEM high-voltage electron microscopy... 

K. (2004) HVEM characterization of crack tip dislocations in silicon crystals, J. Electron Microsc. 53, 353. With permission from Oxford University Press. 

When properly oriented (using LM and SEM in sequence) with respect to particle volume and the heterogeneity contained therein, the analyst can then employ a selective sectioning approach to provide the ultrathin (essentially planar) specimens for TEM analyses of the finest details at a practical resolution near Inm. As STEM instruments continue to improve in quality, versatility, and convenience, the distinctions between TEM and SEM will become blurred. As the potential of the high-voltage EM (or HVEM) becomes more developed for use with the weakly ordered colloid systems taken from natural waters, the need for ultrathin sections should diminish. An HVEM instrument operated at lO keV can achieve the same resolution as a TEM instrument operated at lO keV when using sections 20 times the thickness permitted by TEM. 

Typical ranges of dose and dose rate in power reactors and test reactors together with irradiations with heavy ions, protons and electrons and HVEM irradiation. 

Since electrons with MeV order energies can produce uniform damage to a depth in the order of mm, tensile tests can be conducted as macroscopic mechanical testing. SAXS or SANS can be conducted as well as TEM, atom probe tomography analysis and positron annihilation spectroscopy measurements. In HVEM irradiation, time-dependent evolution of individual defect clusters such as an interstitial loop or a vacancy cluster can be investigated in an irradiated spot area. Microanalysis using an electron beam probe such as energy dispersive X-ray analysis is also applicable in the beam spot area. However, other analyses or measurements on such small areas are difficult to carry out. 

Electron irradiation using a HVEM allows us in situ observations of microstructural evolution under irradiation to high doses in a conventional... 

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