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High-voltage electron microscopy HVEM

Samples of different thicknesses (nsnally semithin or ultrathin sections prepared by ultramicrotomy) can be deformed in tensile devices and the deformed samples investigated directly by sem, esem, sfm, tern, or high voltage electron microscopy (hvem) (Fig. 2c). [Pg.4712]

Inner stmcture, phase distribution High voltage electron microscopy (HVEM), scanning transmission electron microscopy (STEM)... [Pg.142]

HIPS high-impact polystyrene HVEM high-voltage electron microscopy... [Pg.597]

See other pages where High-voltage electron microscopy HVEM is mentioned: [Pg.186]    [Pg.187]    [Pg.55]    [Pg.157]    [Pg.417]    [Pg.455]    [Pg.13]    [Pg.292]    [Pg.186]    [Pg.187]    [Pg.55]    [Pg.157]    [Pg.417]    [Pg.455]    [Pg.13]    [Pg.292]    [Pg.261]    [Pg.643]    [Pg.782]    [Pg.771]   
See also in sourсe #XX -- [ Pg.597 ]



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