HRSEM

Fig. 8.1 HRSEM image of the as-prepared ZnO A single ZnO hexagonal nano-disk (inset) [11]...

HRSEM images of STA-7 were taken using a JEOL JSM-7000F (FE SEM). Images of silicalite-2 and zeolite A were taken on a JEOL JSM-7401F (cold-FE SEM) using the Everhart-Thomley (E-T) secondary electron detector. Samples were not coated but placed on a conductive surface. 

Figure 1 HRSEM images (A, C + E) and AFMerror images (B, D + F) of silicalite 2. A +B is of twinned crystals and C+D of single crystals with E+F at higher magnification...

In the case of zeolite A using a cold-FE SEM all terraces are observable in the HRSEM... 

Figure 3 Composite HRSEM AFM error images of ibidem measurements taken of the surface of zeolite A. The line in green represents the cross section shown in (D)...

The terrace heights are 1.2nm (D) which means that the microscope has a vertical resolution of at least 1.2nm. It is noteworthy that two artifacts towards the top of the AFM image are observed which are absent in the HRSEM image a doubling of surface debris. This artifact is produced by the AFM possessing a double-tip separated by a distance equal to the distance between the two features [12],... 

Zinc chalcogenide thin hlms have been grown by ECALE using zinc sulphate as metal source and sodium sulphide and sodium selenite as chalcogenide precursors.145-148 The formation of the hrst layers of ZnS on (lll)Au has been analyzed by STM and XPS.145 HRSEM images showed that the him surface was very hat, even at an atomic level. On the other hand, thicker ZnS hlms were formed of well-separated crystal nuclei. The stoichiometry of a thicker ZnS him showed a slight excess of sulphur, with a Zn S ratio of 1 1.2. The band gap of a thicker him (deposition time 12 h) was 3.60eV.147... 

Fig. 7.7 HRSEM of pine needles (a) before and (b) after being hydrothermally carbonized at 200 °C for 12 h (c) low-magnification SEM overview of a HTC-treated oak leaf (d) high-magnification picture of the same HTC-treated oak leaf indicating its nanostructure.

Figure 14. (A) HRSEM image of a 120 nm-thick, ferromagnetic 4-nm Fe48Pt52 nanoparticle...

Characterization Surface area of porous electrodes can be calculated from gas -> adsorption, using appropriate models (e.g., the commonly used B.E.T model). The electrode structure can be analyzed by X-ray and neutron diffraction. The pore morphology can be analyzed by electron microscopy (SEM, TEM, HRTEM, and HRSEM). 

Fig. 5 Air-dried gelatin particles using HRSEM left) [4]. Bright field TEM image of hybrid gelatin nanoparticles right) [27]...

Einally, europium oxide nanorods have been prepared by the sonication of an aqueous solution of europium nitrate in the presence of ammonia [85]. The particle sizes measured from transmission electron micrographs and HRSEM are about 50 X 500 nm (W x L). Sonication of an aqueous solution of europium nitrate in the presence of ammonia results in the precipitation of europium hydroxide The as-prepared material is europium hydroxide, as confirmed by TGA, DSC, XPS, and Mossbauer spectroscopy measurements, as well as by PXRD of the as-prepared sample assisted by microwave irradiation... 

Electron microscopy was used to provide more details on the nature of the coke deposits as well as their location. HRSEM reveals the HS-FER crystallites to be platelets, typically 250 nm in size, with a mean thickness of only 20 nm. For a spent HS-FER containing 9.1 %w of coke TEM photographs are displayed in Fig. 7. Careful inspection of the FER platelets reveals that they are bordered by a layer of amorphous material (labelled) which is probably coke. Also at the edge of the platelets there are layers of similar width (picture corresponds to a view down the (100) surfaces as determined by a selected area diffraction study). This suggests that all the external surfaces, both porous and non-porous, contain a layer of coke. To confirm that the amorphous layers indeed consist of carbonaceous material, PEELS spectra were collected which closely resemble that of the amorphous carbon film supporting the sample crystallites. With samples containing less carbon (below 7 %w), TEM does not reveal a coke layer at the surface of the crystallites, but rather reveals discrete coke clusters of 1.0-1.5 run. 

P-19 - Defects study in microporous materials by HRSEM, HRTEM and diffraction techniques... 

Figure 31.17 HRSEM micrograph of graphene laminates obtained from graphite oxide through the Hummers and Offeman procedure [184].

Figure 31.18 (a) HRSEM micrographs of graphene laminates modified with urea and (b) with L-lysine amino acid. 

Figure 4.4 (a) HRTEM images of nanoparticles of Fe203 (b) HRSEM image of Fep2 nanobars (c) HRSEM image of the nanoparticle of FeF2. 

Figure 4.8 (a) HRSEM and (b) HRTEM images of the C0F2 nanoparticles. 

Figure 4.10 HRSEM images of the anisotropic ZnF2 nanostructure.

Analysis methods, used for the investigation of modified surfaces and interfaces, are briefiy reviewed. Emphasis is on the combination of chemical, structural/ morphological, electronic, and optical characterization. Many techniques such as transmission electron microscopy (TEM), standard X-ray photoelectron spectroscopy (XPS) using A1 or Mg K radiation, high-resolution scanning electron microscopy (HRSEM), and standard scanning probe microscopies (AEM in contact... 

The use of surface-sensitive techniques for the development of photoelectrochemical devices that convert solar energy has been described. The essence of this approach is the control of interfacial properties. This is achieved by a combination of empirical procedures that are developed into directed approaches of interface modification for desired electronic, chemical, and structural properties by a feedback between preparation and analysis. Besides the multitude of commercially available surface analytical techniques employed (AFM, STM, TEM, HRSEM, HREELS, SRPES, FTIR), novel methods have been developed such as Brewster angle refiectometry and stationary microwave reflectivity. The detailed highly surface-sensitive analysis of the surface chemistry of samples where electrochemical currents have passed has become possible by the development of in-system photoelectron spectroscopy and HREELS. 

PtsoRuso, determined by COad stripping voltammetry and from HRSEM micrographs of the catalysts, respectively. It is important to remark that the increasing of superficial area indicates that a larger portion of the pores is in the size range of micropores. 

High-iesolution scanning and transmission electron microscopy (HRSEM, HRTEM) can provide very specific information about surface films on any kind of particles. A comparison between pristine particles and particles scraped from cycled electrodes can provide very comprehensive information. Using element analysis, STEM techniques, and selected area electron diffraction (SAED), it is possible to map surface species in a nanometric scale [30]. 

Crack tip opening displacement (CTOD) measurements are complex to undertake due to the need to perform high-resolution scarming electron microscopy (HRSEM). 

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