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Fresnel coefficient

Since p is a complex number, it may be expressed in terms of the amplitude factor tan P, and the phase factor exp jA or, more commonly, in terms of just P and A. Thus measurements of P and A are related to the properties of matter via Fresnel coefficients derived from the boundary conditions of electromagnetic theory. ... [Pg.404]

Information about the properties of the sample are contained in the complex ratio, p, of the Fresnel coefficients of reflection of the parallel (rp) and perpendicular (rg) incident plane polarized electrical field vectors. [Pg.266]

For perpendicular polarized radiation, the reflection (Fresnel) coefficients are given by the expressions ... [Pg.250]

The SFG intensity decreased when PVA gel was in contact with the quartz surface. Weakening of SFG intensity is mostly due to the change in the Fresnel coefficients upon contact with the PVA gel [99]. [Pg.91]

A calculation which can be made to show essentially AR/R for the parallel and vertical components as a function of distance from the electrode. The calculations involve separating the parallel and perpendicular components for each phase utilizing Fresnel coefficients. [Pg.356]

To handle the three-layer problem quantitatively, we write the z = 0 electric field components in terms of complex three-layer Fresnel coefficients ... [Pg.296]

Parameters e, ( = h2) are the dielectric constants of the respective media (which may be complex for light-absorbing materials). Parameters Tp s are the Fresnel coefficients for transmission through a stratified three-medium system with the beam incident from the medium 3 side and an intermediate medium 2 of thickness (5(l0) ... [Pg.296]

Physically, this formula describes the power dissipated by a harmonic oscillator (the emission dipole with moment t) as it is driven by the force felt at its own location from its own emitted and reflected electric field. PT is calculable given all the refractive indices and Fresnel coefficients of the layered model(12 33)... [Pg.302]

At each air-film, film-film, or film-substrate interface, the incident light amplitude is split into a reflected and a transmitted fraction according to die Fresnel coefficients... [Pg.1611]

In this equation, d2u) represents the angle of the radiated SH light with respect to the surface normal, 7(co) is the pump intensity, and e(2co) is the polarization at the SH frequency. The vectors e(co) and e(2co) are related to the unit polarization vectors e(co) and e(2co) in medium 2 by Fresnel coefficients. The effective surface nonlinear susceptibility incorporates the surface nonlinear susceptibility x( and the bulk magnetic dipole contributions to the nonlinearity. The result simplifies since, for isotropic media, there are only three nonzero independent elements of xf These are x%, X% = X%.> and XsfL where 1 =... [Pg.149]

Fig. 5.18. Phasor diagram for the components of the SH polarizability as a function of thallium coverage (0) on Ag(l 10) where ae10 = Zj = x z Skl Fjklxffi and Fjkl are the Fresnel coefficients. Incident wavelength = 1064 nm. Solid lines are vectors representing ]/7sh, anc phase, A Fig. 5.18. Phasor diagram for the components of the SH polarizability as a function of thallium coverage (0) on Ag(l 10) where ae10 = Zj = x z Skl Fjklxffi and Fjkl are the Fresnel coefficients. Incident wavelength = 1064 nm. Solid lines are vectors representing ]/7sh, anc phase, A<ps, for coverages of 0 = 0, 1 ML and 2 ML. Broken lines are vectors representing the adsorbate contribution to ]/7sh and phase, Zl0a, at coverages of 0 = 1 ML and 2 ML. Data at intermediate coverages are represented by the filled circles. From Ref. 146.
This problem was treated in section 1.6 of Chapter 1, where the Fresnel coefficients for reflected and refracted light were calculated and presented in equations (1.74) to (1.77). The problem being treated is pictured in Figure 1.4, and it is convenient to represent the electric vector as a Jones vector having orthogonal components that are either parallel... [Pg.45]

The natural extension of this model is to consider a free-standing film, i.e., a thin transmitting sample not deposited on a substrate. In this case we have two interfaces (assumed to be flat) and transmission and reflection Fresnel coefficients at both interfaces (air/material and material/air). Even though it is not easy to produce such films, some examples are reported in the CP literature [13,14,26,27,32], Assuming that the medium is in vacuum (no = 2 = 1) with thickness d, it is easy to calculate the total reflectance R, and transmittance T of the sample as [21-23]... [Pg.63]

Ellipsometry. Determination of h(u>) by KK analysis and coupled measurements of 1Z and T are affected, respectively, by the problem of the tails added to the experimental R(u>) spectra and by the need to perform 7Z and T measurements separately These problems, which introduce some uncertainty, can be solved by spectroscopic ellipsometry. The technique involves analyzing the polarization of a light beam reflected by a surface. The incident beam must be linearly polarized and its polarization should be allowed to rotate. A second linear polarizer then analyzes the reflected beam. The roles of polarizer and analyzer can be exchanged. The amplitudes of the s and p components of the reflected radiation are affected in a different way by reflection at the surface. The important function describing the process is the ellipsometric ratio p, which is defined as the polarization of the reflected wave with respect to the incident wave, expressed as the ratio between the Fresnel coefficients for p and s polarizations ... [Pg.64]

For n layers, the matrices for each layer are multiplied together, [C] = [Ci][C2]. .. [C + i], to give the resultant reflectivity from the elements of the final 2x2 matrix such that, R = cc jaa. In practice, recurrence relationships between the Fresnel coefficients in the successive layers can be used to provide an efficient calculation. Furthermore, following the approach of Nevot and Croce [20], a Gaussian roughness or diffuse profile can be included at each interface in the stack, such that... [Pg.92]

The SHG intensity from interfaces is determined by the second-order nonlinear susceptibility and the Fresnel coefficients. The SHG spectra of the probe pulses change depending on the transient electronic population and the orientation of the chromophores through these physical quantities. Hohlfeld and coworkers have studied hot electron dynamics in thin metal films by this technique [21]. From the transient response of the SHG intensity, electronic temperature decay due to the electron-phonon coupling in the metal substrate is extracted. Eisenthal and coworkers have studied ultrafast excited state dynamics of dye molecules at liquid interfaces [22]. Particularly, the isomerization dynamics of an organic dye at the interfaces was found to become significantly slower than in the bulk. [Pg.58]

If a mirror is to be an effective optical element then the reflectivity must be as close to 100% as possible. Parratt (1954) gives an expression, derived from the Fresnel coefficient for reflection (Compton and Allison 1935), for the reflectivity, R, for an incidence angle, 6, and critical angle, 0C, for a perfectly smooth homogeneous mirror surface... [Pg.165]

The Fresnel coefficients are complex numbers, describing the amplitude and phase changes of the p and s components. [Pg.451]

Further papers are scarce. The state of the art until about 1967 is given in a review. In this paper also the very complicated equations for the nonsymmetrical geometries are transformed into a more tractable form with the help of Fresnel coefficients. [Pg.342]

Fig. 5. Phase shift of the Fresnel coefficients. Polarization defined as,... Fig. 5. Phase shift of the Fresnel coefficients. Polarization defined as,...
This equation is the so-called basic ellipsometric equation. It contains R and R which depend on the optical properties of the reflecting system, the wavelength of the light X the angle of incidence cp and the experimentally measurable parameters Pand A. For the reflection at a clean interface, the Rp and R are the Fresnel coefficients (246) of the single uncovered interface. They depend only on the refractive indices of the two adjacent phases and the angle of incidence. For systems that do not absorb light the optical constants of the two bulk phases (ambient and substrate media) are usually obtained from the experimental values of P and A for the clean interface (denoted by subscript 0 via Eq. (111). For a layer-covered interface, multiple reflections and refractions take place within the layer (Fig. 24). [Pg.33]

Using the Fresnel coefficients of stratified surfaces, the theoretical angles S and A can be calculated of a surface, whether it consists of a single homogeneous material, a birefringent material, or a combination of absorbing and transparent coatings on a surface. [Pg.454]


See other pages where Fresnel coefficient is mentioned: [Pg.250]    [Pg.301]    [Pg.292]    [Pg.209]    [Pg.295]    [Pg.171]    [Pg.167]    [Pg.169]    [Pg.173]    [Pg.71]    [Pg.66]    [Pg.90]    [Pg.90]    [Pg.5]    [Pg.5]    [Pg.227]    [Pg.306]    [Pg.306]    [Pg.499]    [Pg.243]    [Pg.244]    [Pg.212]    [Pg.202]    [Pg.216]   
See also in sourсe #XX -- [ Pg.149 , Pg.152 , Pg.167 , Pg.169 , Pg.173 , Pg.183 ]

See also in sourсe #XX -- [ Pg.91 , Pg.340 ]

See also in sourсe #XX -- [ Pg.212 , Pg.258 ]

See also in sourсe #XX -- [ Pg.26 , Pg.29 , Pg.36 ]

See also in sourсe #XX -- [ Pg.247 ]




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Fresnel reflection coefficients

Fresnell reflection coefficients

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