Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Plane of incidence

Finally, we can write the signal S( x,y,t) received at time t and for the scanning position (x, y) (the x-axis being in the plane of incidence while the y-axis being normal to it) as an integral over the surface of the defect... [Pg.738]

The external reflection of infrared radiation can be used to characterize the thickness and orientation of adsorbates on metal surfaces. Buontempo and Rice [153-155] have recently extended this technique to molecules at dielectric surfaces, including Langmuir monolayers at the air-water interface. Analysis of the dichroic ratio, the ratio of reflectivity parallel to the plane of incidence (p-polarization) to that perpendicular to it (.r-polarization) allows evaluation of the molecular orientation in terms of a tilt angle and rotation around the backbone [153]. An example of the p-polarized reflection spectrum for stearyl alcohol is shown in Fig. IV-13. Unfortunately, quantitative analysis of the experimental measurements of the antisymmetric CH2 stretch for heneicosanol [153,155] stearly alcohol [154] and tetracosanoic [156] monolayers is made difflcult by the scatter in the IR peak heights. [Pg.127]

Figure Bl.5.5 Schematic representation of the phenomenological model for second-order nonlinear optical effects at the interface between two centrosynnnetric media. Input waves at frequencies or and m2, witii corresponding wavevectors /Cj(co and k (o 2), are approaching the interface from medium 1. Nonlinear radiation at frequency co is emitted in directions described by the wavevectors /c Cco ) (reflected in medium 1) and /c2(k>3) (transmitted in medium 2). The linear dielectric constants of media 1, 2 and the interface are denoted by E2, and s, respectively. The figure shows the vz-plane (the plane of incidence) withz increasing from top to bottom and z = 0 defining the interface. Figure Bl.5.5 Schematic representation of the phenomenological model for second-order nonlinear optical effects at the interface between two centrosynnnetric media. Input waves at frequencies or and m2, witii corresponding wavevectors /Cj(co and k (o 2), are approaching the interface from medium 1. Nonlinear radiation at frequency co is emitted in directions described by the wavevectors /c Cco ) (reflected in medium 1) and /c2(k>3) (transmitted in medium 2). The linear dielectric constants of media 1, 2 and the interface are denoted by E2, and s, respectively. The figure shows the vz-plane (the plane of incidence) withz increasing from top to bottom and z = 0 defining the interface.
The polarizer and analyzer azimuthal angles relative to the plane of incidence must be calibrated. A procedure for doing this is based on the minimum of signal that is observed when the fast axes of two polarizers are perpendicular to each other. For details the reader can consult the literature."... [Pg.407]

In order to understand RAIR spectroscopy, it is convenient to model the experiment (see Fig. 4). Consider a thin film with refractive index n =n ik and thickness d supported by a reflecting substrate with refractive index ni = ri2 — iki- The refractive index of the ambient atmosphere is o- Infrared radiation impinges on the film at an angle of incidence of 6 . The incident radiation can be polarized parallel to or perpendicular to the plane of incidence. [Pg.249]

Fig. 3—Measurement of surface by HDI surface reflectance analyzer. In electromagnetic radiation (light), the polarization direction is defined as the direction of the electric field vector. The incident polarization of the light can be controlled. The instrument uses a variety of detectors to analyze the reflected polarization state of the light. (U.S. Patent 6,134,011). (a) Plane of the disk The SRA uses a fixed 60 degree (from the surface normal) angle of incidence. The plane of incidence is the same as the paper plane (b) Pit on a surface detected by reflected light channels of HDI instrument (c) Scratches on disk surface measured by HDI surface reflectance analyzer (d) Particles on the surface of disk detected by reflected light (black spot) and by scattered light (white spot) [8]. Fig. 3—Measurement of surface by HDI surface reflectance analyzer. In electromagnetic radiation (light), the polarization direction is defined as the direction of the electric field vector. The incident polarization of the light can be controlled. The instrument uses a variety of detectors to analyze the reflected polarization state of the light. (U.S. Patent 6,134,011). (a) Plane of the disk The SRA uses a fixed 60 degree (from the surface normal) angle of incidence. The plane of incidence is the same as the paper plane (b) Pit on a surface detected by reflected light channels of HDI instrument (c) Scratches on disk surface measured by HDI surface reflectance analyzer (d) Particles on the surface of disk detected by reflected light (black spot) and by scattered light (white spot) [8].
In a reflectance or ellipsometry experiment, measurements are always referred to the physical plane of incidence, as defined in Fig. 27.24. If the polarization is parallel to this plane of incidence, the parameters related to it are denoted by the subscript p. For polarization perpendicnlar to the plane, the subscript s is used. When a linearly polarized beam is reflected, one often finds that the parallel and perpendicular components nndergo changes in amplitude and phase. Thus, two beams that are in... [Pg.491]

FIGURE 27.24 Reflection of polarized light. The plane of incidence is defined by the incident and reflected beam. The and p components are indicated for the incident light, with the electric vector normal and parallel, respectively, to the plane of incidence. (From Muller, 1973, with permission from Wiley-VCH.)... [Pg.492]

Reflectance measurements involve measurements of the intensity of light reflected from a flat specular surface of an electrode in a spectroelectrochemical cell. The incident light is polarized either parallel (p) or perpendicular s) to the plane of incidence, as shown in Fig. 27.24. A detector monitors the intensity of the reflected beam. The light is monochromatic, but the spectrometers usually can be tuned over large wavelength ranges. There are excellent reviews of reflectance by McIntyre (1973) and Plieth et al. (1992). [Pg.492]

SHG has been used to study electrode surface symmetry and order using an approach known as SH rotational anisotropy. A single-crystal electrode is rotated about its surface normal and the modulation of the SH intensity is measured as the angle (9) between the plane of incidence and a given crystal axis or direction. Figure 27.34 shows in situ SHG results for an Au(ll 1) electrode in 0.1 M NaC104 + 0.002 M NaBr, using a p-polarized beam. The results indicate the presence of two distinct onefold... [Pg.501]

In the standard setup W (y) is the profile of the primary beam in horizontal direction. In order to solve the smearing integral, the orientation distribution of the layer normals, g (), is approximated by a Poisson kernel121 and W (y) is approximated by a shape function with the integral breadth 2ymax of the primary beam perpendicular to the plane of incidence. In the simplified result... [Pg.201]

Fig. 2.18. (a) The even (upper panel) and odd (lower panel) SH responses of a 20 nm Gd(0001) film at 90 K using 815nm/35fs laser pulses. Transient reflectivity change is also displayed in the upper panel (solid black curve). The inset shows the experimental scheme with the magnetization oriented perpendicular to the plane of incidence, (b) The oscillatory part of the even and odd SH fields extracted from (a). The inset shows the corresponding FT spectra. From [59]... [Pg.40]

The other technique utilizes the different surface sensitivity for s-and p-polarized light - the former has its polarization vector perpendicular, the latter parallel to the plane of incidence. Due to the different... [Pg.203]

The factor 1(0) in Eq. (7.2) is a function of 8 and the polarization of the incident light these features are discussed shortly. However, we first examine the remarkable amplitude, polarization, and phase behaviors of the electric fields [from which 1(0) is derived] and the magnetic fields of the TIR evanescent wave. The field components are listed below, with incident electric field amplitudes Aps and phase factors relative to those of the incident E field s phase at z = 0. (The coordinate system is chosen such that the x-z plane is the plane of incidence. Incident polarizations p and s are parallel and perpendicular to the plane of incidence, respectively.)... [Pg.292]

Fields polarized parallel (p) or perpendicular fr) to the plane of incidence are given by... [Pg.292]


See other pages where Plane of incidence is mentioned: [Pg.738]    [Pg.1284]    [Pg.128]    [Pg.129]    [Pg.288]    [Pg.179]    [Pg.402]    [Pg.404]    [Pg.407]    [Pg.445]    [Pg.704]    [Pg.723]    [Pg.725]    [Pg.266]    [Pg.250]    [Pg.250]    [Pg.242]    [Pg.321]    [Pg.476]    [Pg.495]    [Pg.505]    [Pg.380]    [Pg.346]    [Pg.29]    [Pg.29]    [Pg.201]    [Pg.130]    [Pg.130]    [Pg.169]    [Pg.533]    [Pg.291]    [Pg.212]    [Pg.166]    [Pg.176]    [Pg.6]   
See also in sourсe #XX -- [ Pg.11 , Pg.186 ]

See also in sourсe #XX -- [ Pg.78 , Pg.79 ]

See also in sourсe #XX -- [ Pg.11 , Pg.186 ]

See also in sourсe #XX -- [ Pg.236 , Pg.240 ]

See also in sourсe #XX -- [ Pg.261 ]

See also in sourсe #XX -- [ Pg.129 , Pg.142 ]

See also in sourсe #XX -- [ Pg.150 , Pg.688 , Pg.689 , Pg.720 ]

See also in sourсe #XX -- [ Pg.388 ]




SEARCH



Incidence plane

© 2024 chempedia.info