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Formation fields

Lotus View Camera (Large format field cameras, photo chemicals), Ernsting 73, 5121 Ostermiething, Austria t +43 (0) 62 78 79 325-25 www.lotusviewcamera.at. [Pg.336]

Figure 4. Formation fields mordenite in the absence of (Reproduced with permission Kodansha Ltd., Japan)... Figure 4. Formation fields mordenite in the absence of (Reproduced with permission Kodansha Ltd., Japan)...
Research in chemical formats also suffers from a dearth of open communication channels. Unlike the bioinformatics field, where there is a prevalent practice of openness including open access to most literature articles, the chemistry field is relatively insular. Limited availability of information experts restricted the development of the chemical format field, where most contributors are much stronger in chemistry than in software architecture and programming. [Pg.117]

A New Model. The results of the studies on anodic oxide films (see section 5.9 and chapter 3 on passive film and anodic oxides) show that anodic oxide properties (oxidation state, degree of hydration, 0/Si ratio, degree of crystallinity, electronic and ionic conductivities, and etch rate) are a function of the formation field (the applied potential). Also, they vary from the surface to the oxide/silicon interface, which means that they change with time as the layer of oxide near the oxide/silicon interface moves to the surface during the formation and dissolution process. The oxide near the silicon/oxide interface is more disordered in composition and structure than that in the bulk of the oxide film. Also, the degree of disorder depends on the formation field which is a function of thickness and potential. The range of disorder in the oxide stmcture is thus responsible for the variation in the etch rate of the oxide formed at different times during a period of the oscillation. The etch rate of silicon oxides is very sensitive to the stmcture and composition (see Chapter 4). [Pg.215]

In a given solution, the rate of oxide growth is a function of the field, that is, Ta =fiyid). The dissolution rate of oxide is a function of solution composition, formation field, and the time lapse between formation and dissolution of the oxide, Ia-b. that is, i B =y([F]. pH, VId, fA-B). At a steady state, the rate of oxide growth equals the rate of its dissolution, ta = r, and the thickness of the oxide film is constant. When dJr Ia-b, that is, the oxide formed at A has different properties and a different etch rate from that at point B when oxide A reaches the surface, r, oscillation can occur when the following condition exists. [Pg.216]

The clear aluminosilicate solutions from which Ueda et al (JD studied crystallisation of zeolites Y, S and P were based on the composition range 10Na2<>. (0.35-0.55)A1 0. (22-28)SiO. (250-300)H O. Figure 1 shows the region in which gel and solution co-existea (cross-hatched), the region of clear solution, and the formation fields of the three zeolites from the clear solution. [Pg.19]

C SEPARATED BY COMMAS IN FIELDS NOT EXCEEDING FORMATTED FIELD... [Pg.559]

When the carboxyl group and hydroxyl group are present in the same molecule, an intramolecular esterification may occur and a cydic ester (called a lactone) may be formed. Lactonization requires an acceptable conformation the two groups must be close and spatially positioned to react. Ring closure is especially favorable if lactone formation )fields five- or six-membered (stable and rapidly formed) ring systems. [Pg.198]

Fig. 156. Format Field Availability (FA) in combination with the field Chemical Name (CN), sample piceol... Fig. 156. Format Field Availability (FA) in combination with the field Chemical Name (CN), sample piceol...
Therefore it is wise to search in both databases. Using the display format Field Availability (FA) the available information can be compared easily. Fig. 160 shows a document from Gmelin in format IDE. [Pg.260]


See other pages where Formation fields is mentioned: [Pg.191]    [Pg.208]    [Pg.78]    [Pg.12]    [Pg.8]    [Pg.51]    [Pg.66]    [Pg.411]    [Pg.456]    [Pg.302]    [Pg.334]    [Pg.256]   


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