Electron microscopy imaging principle

Martin s diameter and Feret s diameter of a particle depend on the particle orientation under which the measurement is made. Thus, obtaining a statistically significant measurement for these diameters requires a large number of randomly sampled particles which are measured in an arbitrarily fixed orientation. Since Martin s diameter, Feret s diameter, and projected area diameter are based on the two-dimensional image of the particles, they are generally used in optical and electron microscopy. The principles of microscopy as a sizing method are discussed in 1.2.2.2. 

Figure 7.23 Ordering of adsorbates on a surface into islands gives rise to regions of different work function, which can be imaged because of the associated differences in photoelectron intensity. The principle forms the basis of photoemission electron microscopy (PEEM). The same principle underlies the imaging of single molecules in the field electron microscope (FEM) (see also Fig. 7.9).

Transmission electron microscopy (TEM) is a powerful and mature microstructural characterization technique. The principles and applications of TEM have been described in many books [16 20]. The image formation in TEM is similar to that in optical microscopy, but the resolution of TEM is far superior to that of an optical microscope due to the enormous differences in the wavelengths of the sources used in these two microscopes. Today, most TEMs can be routinely operated at a resolution better than 0.2 nm, which provides the desired microstructural information about ultrathin layers and their interfaces in OLEDs. Electron beams can be focused to nanometer size, so nanochemical analysis of materials can be performed [21]. These unique abilities to provide structural and chemical information down to atomic-nanometer dimensions make it an indispensable technique in OLED development. However, TEM specimens need to be very thin to make them transparent to electrons. This is one of the most formidable obstacles in using TEM in this field. Current versions of OLEDs are composed of hard glass substrates, soft organic materials, and metal layers. Conventional TEM sample preparation techniques are no longer suitable for these samples [22-24], Recently, these difficulties have been overcome by using the advanced dual beam (DB) microscopy technique, which will be discussed later. 

Images obtained by cryo electron microscopy should in principle be able to distinguish between the structural features proposed by the different models mentioned above [16]. The micrographs show a zig-zag motif at lower salt concentrations and they indicate that the chromatin fiber becomes more and more compact when the ionic strength is raised towards the physiological value (i.e., about 150 mM monovalent ions). 

Tip-sample interactions 36, 195—210 force and deformation 37 local modification of sample wavefunctions 195 uncertainty principle, and 197 wavefunction modification 37 Topografiner 44—47 Topographic images 122, 125 Transient response 261, 262 Transition probability 67 Transmission electron microscopy 43... 

In the following, we will review several imaging techniques, either based on beam/matter interactions (like electron microscopy either TEM or SEM) or techniques that probe the short distance interactions (like AFM), as they are well suited for the observation of nano-objects and have been extensively used to study nanotubes alone. The principles and the main results on polymer/nanotube composites provided by these imaging techniques (AFM, TEM and SEM) will be presented. 

The principle of the scanning transmission electron microscope (STEM) is, at first glance, very different from that of the transmission electron microscope the electrons are focused on a probe scanned on a sample and the transmitted electrons are detected on a scintillator via a collection aperture. There is, however, a so-called reciprocity relationship between transmission electron microscopy and the STEM that can be used to describe image formation using the same formalism and facilitates the understanding of contrast. 

On the other hand, optical microscopy, confocal microscopy, ellipsometry, scanning electron microscopy (SEM), scanning tunneling microscopy (STM), atomic force microscopy (AFM) and total internal reflection fluorescence (TIRF) are the main microscopic methods for imaging the surface structure. There are many good books and reviews on spectroscopic and chemical surface analysis methods and microscopy of surfaces description of the principles and application details of these advanced instrumental methods is beyond the scope of this book. 

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