Electric force microscopy EFM

Force Modulation Mode Contact Electric Force Microscopy (EFM) Young s Modulus Microscopy (YMM) Scanning near-field acoustic Force-distance measurements... 

Many-pass techniques Electric Force Microscopy (EFM) Scanning Capacitance Microscopy (SCaM) Kelvin Probe Microscopy (SKM) DC Magnetic Force Microscopy (DC MFM) AC Magnetic Force Microscopy (AC MFM) Dissipation Force Microscopy-Scanning Surface Potential Microscopy (SSPM) Scanning Maxwell Stress Microscpy (SMMM) Magnetic Force Microscopy (MFM) Van der Waals Force Microscopy (VDWFM)... 

Atomic Force Microscopy (AFM), Kelvin Probe Force Microscopy (KFM), and Electric Force Microscopy (EFM)... 

Another widely used application of dynamic modes is the investigation of surface electrical characteristics. Electrical force microscopy (EFM) comprises a set of related techniques [70], and provides the possibility of probing locahzed charge distribution. 

Atomic force microscopy (AFM) and electrochemical atomic force microscopy (ECAFM) have proven usefiil for the study of nucleation and growth of electrodeposited CP films on A1 alloy [59]. AFM was used to study adhesion between polypyrrole and mild steel [60], whereas electric force microscopy (EFM) has been used to study local variations in the surface potential (work function) of CP films [61]. AFM with a conductive tip permits a nanoscale AC impedance measurement of polymer and electrolyte interfaces, permitting differentiation between highly conductive amorphous regions and less-conductive crystalline regions of the CP film [62]. 

The electrical property of CdSe nanofibres is an important aspect of the optoelectronic properties, which are dependent on quantum confinement effects. Electric force microscopy (EFM) was used to measure the dielectric behaviour of CdSe QDs to explore the use of the generated nanofibres in different applications [49]. The Coulomb interactions between the EFM probe and the CdSe nanoparticles were different to the ELP matrix. These reflected in form of a phase-shift of the cantilever oscillation [34]. This phase-shift resolves differences in the electrostatic interaction forces, as shown in Fig. 7. The EFM image shown in Fig. 7b, in comparison with the AFM image in Fig. 7a, reveals the alignment of discrete CdSe nanoparticles separated by the ELP shell within the nanofibres. 

Fig. 7 AFM height images (a) and electric force microscopy (EFM) phase image (b) of ELP-CdSe nanofibres deposited on Si/Si02 substrates. The inset in (b) shows a magnified section of an individual nanofibre the CdSe nanoparticles within the fibres are visible. Reprinted with permission Ifom Fahmi et al. [34]. Copyright, 2010, Wiley-VCH...

H-aggregated gel is produced that shows typical blue-shifted electronic absorptions and forms either nanorods or nanorings that were characterized by AFM and electrical force microscopy (EFM). Charge delocalization along the nanostructures was observed by the latter technique. 

Electrical Force Microscopy (EFM) can provide surface potential and charge distribution maps to a spatial resolution of a couple of nanometers. Information is derived by scanning an atomically sharp tip over the surface of interest and measuring the deflection resulting from the electrostatic force. This is sometimes termed... 

Electric force microscopy (EFM) or Scanning maxwell stress microscopy (SMM)... 

The second application of noncontact AFM is in near-field detection of force gradients at 5-50 nm above the surface. This is the approach used in electric force microscopy (EFM) [158] and magnetic force microscopy (MFM) [159]. 

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