Atomic force microscopy electrochemical

The atomic structures corresponding to Cd UPD on Au (100) plane were revealed using electrochemical atomic force microscopy (AEM) technique [241, 266]. 

Figure 17-27 Gold microelectrode with spherical tip. [From J. Abbou. C. Demaille. M. Druet, and J. MoirouK "Fabrication of Submicromeler-Sized Gold Electrodes of Controlled Geometry for Scanning Electrochemical-Atomic Force Microscopy," Anal. Chem. 2002, 74,6355.]...

Atomic force microscopy (AFM) and electrochemical atomic force microscopy (ECAFM) have proven usefiil for the study of nucleation and growth of electrodeposited CP films on A1 alloy [59]. AFM was used to study adhesion between polypyrrole and mild steel [60], whereas electric force microscopy (EFM) has been used to study local variations in the surface potential (work function) of CP films [61]. AFM with a conductive tip permits a nanoscale AC impedance measurement of polymer and electrolyte interfaces, permitting differentiation between highly conductive amorphous regions and less-conductive crystalline regions of the CP film [62]. 

R., Andreas Friedrich, K., and Roduner, E. (2007) Electrochemical atomic force microscopy study of proton conductivity in a Nafion membrane. Phys. Chem. Chem. Phys., 9, 2735-2743. Sagarik, K., Phonyiem, M.,... 

Kubo, K., Hirai, N., Tanaka, T. and Hara, S. (2003) In situ observation on Au(100) surface in molten F.MTmBF(4) by electrochemical atomic force microscopy. Surface Science, 546, L785-L788. 

Holder, M.N., Gardner, C.E., Macpherson, J.V. and Unwin, P.R. (2005) Combined scanning electrochemical-atomic force microscopy (SECM-AFM) Simulation and experiment for flux-generation at un-insulated metal-coated probes. Journal of Electroanalytical Chemistry, 585, 8-18. 

Vidu R, Ku JR, Stroeve P (2006) Growth of ultrathin films of cadmium telluride and tellurium as studied by electrochemical atomic force microscopy. J Colloid Interface Sci 300 404... 

Structure of the GaAs(lOO) Surface During Electrochemical Reactions Determined by Electrochemical Atomic Force Microscopy... 

Macpherson JV, Unwin PR (2000) Combined scanning electrochemical—atomic force microscopy. Anal Chem 72(2) 276-285... 

Macpherson, J. V., and P. R. Unwin, Combined scanning electrochemical-atomic force microscopy, Anal. Chem., Vol. 72, 2000 pp. 276-285. 

Kueng, A., C. Kranz, B. Mizaikoff, A. Lugstein, and E. Bertagnolli, Combined scanning electrochemical atomic force microscopy for tapping mode imaging, Appl. Phys. Lett., Vol. 82, 2003 pp. 1592-1594. 

Derylo, M. A., K. C. Morton, and L. A. Baker, Parylene insulated probes for scanning electrochemical-atomic force microscopy, Langmuir, Vol. 27, 2011 pp. 13925-13930. 

Anne, A., Demaille, C., and Goyer, C. 2009. Electrochemical atomic-force microscopy using a tip-attached redox mediator. Proof-of-concept and perspectives for functional probing of nanosystems. ACS Nano 3 349-353. 

---