EDAX, EDX

As indicated in Fig. 7.2, X-rays are among the by-products in an electron microscope. Already at the beginning of this century, people knew that matter emits X-rays when it is bombarded with electrons. The explanation of the phenomenon came with the development of quantum mechanics. Nowadays, it is the basis for determining composition on the submicron scale and, with still increasing spatial resolution, is used in the technique referred to as Electron Microprobe Analysis (EMA), Electron Probe Microanalysis (EPMA) or Energy Dispersive Analysis of X-rays (EDAX, EDX) [21]. 

EDAX , EDX Energy-dispersive X-ray ET-AAS atomic absorption spectrometry... 

A scanning electron microscope can also be equipped with additional instmmentation for electron-excited x-ray analysis (9). In many systems, this is performed in the mode known as energy dispersive x-ray analysis (edx). Other common acronyms for this method are eds for energy dispersive spectroscopy or edax for energy dispersive analysis of x-rays. 

Energy Dispersive X-Ray Analysis (EDX, EDAX) Field Emission Microscopy (FEM)... 

BASIL CIS CV CVD DSSC ECALE EC-STM EDX, EDS, EDAX EIS EMF EQCM FAB MS FFG-NMR Biphasic Acid Scavenging Utilizing Ionic Liquids Copper-indium-selenide Cyclic Voltammetry Chemical Vapor Deposition Dye Sensitized Solar Cell Electrochemical Atomic Layer Epitaxy Electrochemical in situ scanning tunnelling microscopy Energy Dispersive X-ray analysis Electrochemical Impedance Spectroscopy Electromotive Force Electrochemical Quarz Crystal Microbalance Fast atom bombardment mass spectroscopy Fixed Field Gradient Nuclear Magnetic Resonance... 

As illustrated by Fig. 10.4, an electron microscope offers additional possibilities for analyzing the sample. Diffraction patterns (spots from a single-crystal particle and rings from a collection of randomly oriented particles) enable one to identify crystallographic phases as in XRD. Emitted X-rays are characteristic for an element and allow for a determination of the chemical composition of a selected part of the sample (typical dimension 10 nm). This technique is called electron microprobe analysis (EMA, EPMA) or, referring to the usual mode of detection, energy dispersive analysis of X-rays (EDAX or EDX). Also the Auger electrons carry information on sample composition, as do the loss electrons. The latter are potentially informative on the low Z elements, which have a low efficiency for X-ray fluorescence. 

Selected samples from various experiments were analyzed in energy dispersive X-ray spectroscopy (EDX). These analyses were carried out on a Hitachi S-4500 field emission scanning electron microscopy equipped with an EDAX Phoenix model EDX spectrometer. An electron beam of 15 kV was used. These samples were also analyzed in a Krafos Axis Ulfra X-ray phofoelectron spectroscopy (XPS). 

For TEM investigations, the powder samples of the catalysts were ultrasonically dispersed in ethanol and mounted onto a copper grid covered with holy carbon film. A Philips CM200 FEG electron microscope, operating at 200 kV and equipped with a Gatan imaging filter, GIF 100, was used for TEM observation. EDX analysis was performed in the same microscope using a DX4 analyzer system (EDAX). 

EDX analyses (EDAX is, in fact, the brand name of the EDX detector produced by EDAX, a division of Ametek) provide valuable information about relative amounts of elements and the location of these elements on the surface [268,270,271]. 

The EDX analyses (EDAX is in feet the brand name of EDX detector produced by EDAX, division of Ametck), besides relative amounts of the elements, can also provide valuable information about location of these elements on the surfece. This is especially important in the study of catalysts and formation of new carbonaceous materials such as, for instance, carbon nonotubes [284, 285] nanoparticles [286] or nanofilms [287]. Fig. 22 presents EDX spectra for polymeric salt-based carbons containing various amounts of transition metals [282],... 

Elemental analysis was carried out using a thin-window EDAX energy-dispersive X-ray (EDX) detector and microanalysis system (EDAX Inc., USA). It was not possible to analyse the sample at temperatures above 400 because the infrared radiation from the heating stage would swamp the X-ray detector. Therefore, for temperatures above this value, the sample temperature was first lowered to 350 °C for the analysis, and then restored to its prior setting. Since any evolved gas was constantly being pumped away and the pressure inside the chamber was only 2 Torr, the chances of reverse reactions taking place were absolutely minimal. 

The microstructuie of polished specimens (finished with I um diamond paste) was observed by FSEM (GENESIS, INC. USA.) and (.TSE-6460, JEOL INC.) in BSE mode coupled with EDX (EDAX INC. USA.), and the fractured surface was observed in the secondary electron (SE) mode. Only metallic... 

EDX EDX spectra were acquired using an EDAX microanalysis system fitted to an FEI Quanta 200 SEM. Line scans perpendicular to the articular... 

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