EDAX

A scanning electron microscope can also be equipped with additional instmmentation for electron-excited x-ray analysis (9). In many systems, this is performed in the mode known as energy dispersive x-ray analysis (edx). Other common acronyms for this method are eds for energy dispersive spectroscopy or edax for energy dispersive analysis of x-rays. 

Surface composition and morphology of copolymeric systems and blends are usually studied by contact angle (wettability) and surface tension measurements and more recently by x-ray photoelectron spectroscopy (XPS or ESCA). Other techniques that are also used include surface sensitive FT-IR (e.g., Attenuated Total Reflectance, ATR, and Diffuse Reflectance, DR) and EDAX. Due to the nature of each of these techniques, they provide information on varying surface thicknesses, ranging from 5 to 50 A (contact angle and ESCA) to 20,000-30,000 A (ATR-IR and EDAX). Therefore, they can be used together to complement each other in studying the depth profiles of polymer surfaces. 

EDAX date Cd S ffflC amount o f pig.5. Proposed Mechanism... 

Emrich et al.112 using X-ray photoelectron spectroscopy (XPS) data, and Lundgren and Murray,113 using CY, EDAX, XPS, elemental analytical, and spectroelectrochemical measurements, both confirmed /-PB as the initially deposited form with a gradual transformation to s-PB on potential cycling. Other support for the /-PB to s-PB transformation comes from an... 

Epichlorohydrin copolymer with ethylene oxide. EDAX... 

The alternative approach to detection and analysis incorporates a solid state detector and a multichannel pulse height analysis system. The crystals used are of silicon (of the highly pure intrinsic type), or the lithium drift principle (p. 463 etseq.) is utilized. All emitted radiations are presented to the detector simultaneously and a spectrum is generated from an electronic analysis of the mixture of voltage pulses produced. Chapter 10 contains a more detailed account of pulse height analysis and solid state detectors. Production of an X-ray spectrum in this way is sometimes known as energy dispersive analysis ofX-rays (EDAX) and where an electron microscope is employed as SEM-EDAX. 

Of all of the machines used for microanalysis LAMMA seems to be the most problematic. A laser beam is used to disintegrate a spot in the sample, and the material emitted is then analyzed in a mass spectrometer. It has similar lateral resolution to PIXE, and like SIMS can be used to distinguish between isotopes of the same element. It has, however, proved very difficult to quantify, and is destructive to the specimen. One recent investigation (13) ofthe distribution of stable isotopes of calcium, magnesium, and potassium in Norway spruce used three microprobes EDAX at 0.3 pm lateral resolution isotope specific point analysis, using LAMMA at 1.5 pm lateral resolution and isotope specific imaging using SIMS at 1-3 pm lateral resolution. 

Table 1 Some Recent Investigations Using Cryo-SEM and EDAX ...

Energy Dispersive X-Ray Analysis (EDX, EDAX) Field Emission Microscopy (FEM)... 

As indicated in Fig. 7.2, X-rays are among the by-products in an electron microscope. Already at the beginning of this century, people knew that matter emits X-rays when it is bombarded with electrons. The explanation of the phenomenon came with the development of quantum mechanics. Nowadays, it is the basis for determining composition on the submicron scale and, with still increasing spatial resolution, is used in the technique referred to as Electron Microprobe Analysis (EMA), Electron Probe Microanalysis (EPMA) or Energy Dispersive Analysis of X-rays (EDAX, EDX) [21]. 

Bolton, A.J., Dinwoodie, J.M. and Davies, D.A. (1988). The validity of the use of SEM/EDAX as a tool for the detection of UE resin penetration into wood cell walls in particleboard. Wood Science and Technology, 22(4), 345-356. 

---