EDAX-analysis

Fig. 2. SEM backscattered electron image of a Type II vein containing euhedral to cataclastically brecciated arsenopyrite (asp), pyrite (py), quartz, and calcite. A thin Type 1 quartz vein showed a SEM-EDAX analysis of a very fine-grained mineral mass rich in Hg-Au-As vein (arrow).

Figure 7. SEM-EDAX Analysis of Pilot Plant Samples Silicon. Top left, 30 hours top right, 60 hours and bottom, 80 hours.

Figure 9. SEM-EDAX Analysis of Steam-Deactivated Samples Silicon.

Figure 11. SEM-EDAX Analysis of Cerium/Alumina Silicon. Top left, pure silica top right, silica alumina and bottom, molecular sieve.

The chemical composition was analyzed in the same equipment and with the same conditions previously reported for the LECA zeolite. Table 4.8 reports the chemical composition (in wt %) of the Na-CS W sample, determined by EDAX analysis in a JEOL 5800 LV model SEM equipped with an energy dispersive x-ray analysis accessory, EDAX-DX-4 [41],... 

Scanning electron microscopy and EDAX analysis evaluations shown in Figure 3 are typical of the analyses obtained on all of... 

Figure 3. Scanning electron microscope and EDAX analysis of (A) LZ-241 Ti substituted ZSM-5 1.3 wt.% TiOz (B) LZ-226 Ti substituted NH4Y 11.4 wt.% TiOz (C) LZ-226 Fe substituted HsO mordenite 3.8 wt.% Fe2Os.

I was characterized by powder X-ray diffraction (PXRD), energy dispersive analysis of X-rays (EDAX), chemical analysis, thermogravimetric analysis (TGA) and IR spectroscopy. EDAX analysis indicated the ratio of Mn S to be 3 2. The presence of fluorine was confirmed by analysis and the percentage of fluorine estimated by EDAX in a field emission scanning electron microscope was also satisfactory. Thermogravimetric analysis also confirms the stoichiometry of the compound. Bond valence sum calculations6 and the absence of electron density near fluorine in the difference Fourier map also provide evidence for the presence of fluorine. The sulfate content was found to be 30.8% compared to the expected 32% on the basis of the formula. 

EDAX analysis of these materials, as illustrated in Figures 2b and 3b, shew little difference between the samples with the exception of the silicon peak found in the carbon-silicon alloy. It should be noted that EDAX is inherently insensitive to the lower atomic number elements due to the low fluorescent yields of the lighter elements, internal absorption, and low transmission factors for these elements through the beryllium detector window of the instrument. Thus, carbon and oxygen are notably absent from the conventional EDAX spectra. 

Figure 6. EDAX analysis of particulate area circled in Figure 5a. Note additional aluminum and iron lines in spectrum, assumed to result from the polishing process. Vertical scale = 25,000 counts, data accumulation time 100 s.

From SEM-EDAX analysis it is revealed that in the sample doped with Pb-Co (1-7) (0.3)22(2.91) (0.99) , sintered for 144h at 850°C, the 2223 phase has a chemical formula of Bii.7Pbo.3Sr2Ca2(Cui.xCox)30y, where x=0.050. 

The EDAX analysis does not give very accurate quantitative results for the magnesium aluminum silicate because the three elements (Mg, Al, and Si) are next to each other in the periodic table thus we can expect some peak overlapping. 

FIGURE 16.3-2 ( ) Scanning electron micrograph of u hematite sample on which spill analysis was conducted, (b) EDAX analysis of spot G shown in part (a). Analysis of spot E was similar to that obtained for spot G. (< ) EDAX analysis of spot H as shown in pari (a). (After Kulkami and Somasundaran 1 courtesy of Elsevier Seuijoia S.A.. Lausanne. Switzerland.)... 

Figure 3. SEM images of (A) Nl-TLC, (B) N2-TLC, (C) N3-TLC and (D) N4-TLC samples preparation of the TLC support. The high magnification image of the Nl-TLC sample (Fig. 2D) shows that NiO randomly distributes on TLC surface. Further, it can be clearly observed that larger particles are constituted by several NiO particles 8 nm in size, grouped each other to form NiO clusters with different size (20-40 nm) and shape. As the Ni loading increases (Fig. 3A-D) the agglomeration process of the NiO particles is enhanced and cluster up to 80-100 nm are obtained (Fig. 3D). In any case, the surface elemental EDAX analysis indicates that NiO is the predominant species at the TLC surface, whereas only a trace amoimt of Si on the surface of the N4-TLC sample has been detected.

Energy Dispersive Analysis of X-Rays (EDAX). Analysis for the presence of LiBr in slices of the dry extracted hydrogel was performed using a Cambridge scanning electron microscope (SEM) equipped with an EDAX attachment. Each sample was counted for over 200 s at a 200 x magnification. 

---