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Direct-deposition processing techniques sputtering

Understanding the dependence of film structure and morphology on system layout and process parameters is a core topic for the further development of ZnO technology. Work is being performed on in situ characterization of deposition processes. Growth processes are simulated using Direct Simulation Monte-Carlo (DSMC) techniques to simulate the gas flow and sputter kinetics simulation and Particle-ln-Cell Monte-Carlo (PICMC) techniques for the plasma simulation [132]. [Pg.228]

The deposition of nanostructured Ti02-based material directly on glass is expected to achieve enhanced photocatalysis and mechanical strength. Sputtering and a combination of sputtering and sol-gel techniques seem to be the most adequate for such a purpose [91,97,98], In the latter case, porous alumina Trims on glass formed by anodizing sputter-deposited A1 layers were used as templates in the successive sol-gel process. [Pg.436]

The rapid development of solid state physics and technology during the last fifteen years has resulted in intensive studies of the application of plasma to thin film preparation and crystal growth The subjects included the use of the well known sputtering technique, chemical vapour deposition ( CVD ) of the solid in the plasma, as well as the direct oxidation and nitridation of solid surfaces by the plasma. The latter process, called plasma anodization 10, has found application in the preparation of thin oxide films of metals and semiconductors. One interesting use of this technique is the fabrication of complementary MOS devices11. Thin films of oxides, nitrides and organic polymers can also be prepared by plasma CVD. [Pg.140]

The most widely used vacuum deposition techniques are evaporation and sputtering, often employed for smaller substrates. In the evaporation process, heating the metal by an electron beam or by direct resistance produces the vapours. The system is operated at a very high vacuum (between 10-5 and 10 6 Torr) to allow a free path for the evaporant to reach the substrate. The rate of metal deposition by evaporation processes varies from 100 to 250,000 A min h These processes can be operated on a batch or a continuous scale. On the other hand, in the case of the sputtering technique, the reaction chamber is first evacuated to a pressure of about 10-5 Torr and then back-filled with an inert gas up to a pressure of 100 mTorr. A strong electric field in the chamber renders ionisation of the inert gas. These inert gas ions... [Pg.236]

Last years considerable efforts have been directed to preparation of metal nanoparticles having a desired diameter and shape. A number of production techniques has been reported such as wet chemical processes, (co-precipitation, complexation, sol-gel), physical vapor deposition, sputtering, and laser ablation methods [1]. The ultimate goal of each technique is fabrication of monodisperse stmctures with a predetermined size, shape and arrangement. [Pg.163]

Besides the chemical and radiochemical composition, other properties of the collected materials are also often of interest, such as the natine of the chemical compounds present in these substances. For example, the structure of oxide compounds after isolation from the base material or from the coolant is analyzed by X-ray diffractometry or by Mdssbauer spectrometry. Other microanalytical techniques can be directly applied to oxide layers deposited on surfaces, e. g. of steam generator tube sections. Examples in this field are Auger electron spectroscopy for the determination of element concentrations in micrometer areas and X-ray induced photoelectron spectroscopy for the determination of the chemical states of the individual elements. In order to obtain depth profiles over the thickness of the oxide layer, these techniques often are combined with an argon sputtering process (e. g. Schuster et al., 1988), which removes nanometer fractions from the swface prior to the next analysis step. By y spectrometry of the specimen after each sputtering step, the profile of the radionuclides in the oxide layer can also be determined. [Pg.262]


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Deposition process

Direct Process

Direct sputtering

Direct-deposition processing techniques

Directed processes

Directing process

Processing techniques

Sputter deposition processes

Sputtered

Sputtering

Sputtering process

Sputtering techniques

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