Scanning high-energy electron diffraction

SHEED Scanning high-energy electron diffraction [106] Scanning version of HEED Surface heterogeneity... 

There are a number of variants of LEED. Diffraction of high energy electrons (= 20 keV) can also be used provided that the studies are done at grazing incidence. If the surface is scanned with this technique, information on the structural surface heterogeneity is obtainable. 

Reflected High Energy Electron Diffraction Scanning Reflection Electron Microscopy... 

For single crystal substrates which are not in the form of thin films, the techniques of transmission microscopy and nanodiffraction can not be used. For such cases, the techniques of reflection electron microscopy (REM) or its scanning variant (SREM) and reflection high energy electron diffraction (RHEED), in the selected area or convergent beam modes, may be applied (18). 

Rutherford Backscattering Spectroscopy Reflection High-Energy Electron Diffraction Scanning Electron Microscopy Surface (Sensitive) Extended X-Ray Absorption Fine Structure... 

Rutherford backscattering spectroscopy reflected high energy electron diffraction scanning Auger microscopy... 

Surface analytical methods — Important ex situ methods for surface analysis are X-Ray Photoelectron Spectroscopy (XPS) UV-Photoelectron Spectroscopy (UPS), Auger Electron Spectroscopy (AES), Ion Scattering Spectroscopy (ISS), Rutherford Backscattering (RBS), Secondary Ion Mass Spectroscopy (SIMS), Scanning Electron Microscopy (SEM), Electron Microprobe Analysis (EMA), Low Energy Electron Diffraction (LEED), and High Energy Electron Diffraction (RHEED). 

The surface and the bulk PSC crystal quality was studied by reflection high-energy electron diffraction (RHEED) and X-ray diffraction (XRD). Surface chemical compositions were determined with Auger electron spectroscopy (AES) and secondary-ion mass spectrometry (SIMS). Atomic force microscopy (AFM), transmission and scanning electron microscopy (TEM and SEM) were used to monitor PSC morphology and structure. 

Fig. 1. Experimental techniques available for surface studies. SEM = Scanning electron microscopy (all modes) AES = Auger electron spectroscopy LEED = low energy electron diffraction RHEED = reflection high energy electron diffraction ESD = electron stimulated desorption X(U)PS = X-ray (UV) photoelectron spectroscopy ELS = electron loss spectroscopy RBS = Rutherford back scattering LEIS = low energy ion scattering SIMS = secondary ion mass spectrometry INS = ion neutralization spectroscopy.

S)FEM (Scanning) Fransmission Eleclron Microscopy Thin specimen-<200 nm High energy electrons typically 300 keV Transmitted and diffracted electrons (Sample thickness) 2-20 nm (Defect) structure of cryst. solids microchemistry high resol. 0.2 nm 33... 

Surface high-energy electron diffraction Scanning electron microscope Surface-enhanced Raman spectroscopy Surface-enhanced resonance Raman spectroscopy... 

As shown above, scanning probe microscopies (mostly STM) have provided many of the data on the structure of passive films. Prior to the advent of scanning probe microscopies, a few data were available, obtained by reflection high energy electron diffraction (RHEED). For example, the crystallinity and epitaxy of the passive film... 

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