Scanning reflection electron

Reflected High Energy Electron Diffraction Scanning Reflection Electron Microscopy... 

Surface Extended X-ray Absorption Fine Structure Surface Integrated Molecular Orbital/Molecular Mechanics Scanning Reflection Electron Microscopy Scanning Tunneling Microscope [or Microscopy]... 

A. J. Bevolo. Scanning Electron Microscopy. 1985, vol. 4, p. 1449. (Scanning Electron Microscopy, Inc. Elk Grove Village, IL) Thorough exposition of the principles and applications of reflected electron energy-loss microscopy (REELM) as well as a comparison to other techniques, such as SAM, EDS and SEM. 

For single crystal substrates which are not in the form of thin films, the techniques of transmission microscopy and nanodiffraction can not be used. For such cases, the techniques of reflection electron microscopy (REM) or its scanning variant (SREM) and reflection high energy electron diffraction (RHEED), in the selected area or convergent beam modes, may be applied (18). 

In contrast to the TEM, the scanning electron microscope (SEM) works somewhat like a TV cathode-ray tube. An electron gun is used to scan a surface with the help of deflection coils and focusing lenses in a raster pattern, and the reflected electron signal is used synchronously to generate an image of very high magnification on a screen. The SEM has been in... 

Figure 13.22. Reflection electron microscopy (REM) is an old technique that was revived in the 1980s but is still not widely used. The sample is essentially bulk material with just one surface viewed. The electrons are diffracted off the surface as in RHEED (the diffraction pattern looks just like any other RHEED pattern), and are then imaged by the TEM in the usual way. The resolution is about 0.7 nm and chemical analysis can be considered as shown by the AEGai (As/GaAs superiattice in this image square millimeters of surface can be viewed just by scanning the sample. Notice the foreshortening.

Scanning electron microscope (SEM) A type of electron microscopy in which a beam of electrons is scanned across an object, and the pattern of reflected electrons is analyzed to crease an image of the object s surface. This type of microscope is used to study the surfaces of specimens. Compare transmission electron microscopy. 

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