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Reflection electron microscopy

Reflected High Energy Electron Diffraction Scanning Reflection Electron Microscopy... [Pg.768]

For single crystal substrates which are not in the form of thin films, the techniques of transmission microscopy and nanodiffraction can not be used. For such cases, the techniques of reflection electron microscopy (REM) or its scanning variant (SREM) and reflection high energy electron diffraction (RHEED), in the selected area or convergent beam modes, may be applied (18). [Pg.352]

Surface Extended X-ray Absorption Fine Structure Surface Integrated Molecular Orbital/Molecular Mechanics Scanning Reflection Electron Microscopy Scanning Tunneling Microscope [or Microscopy]... [Pg.822]

K. Honda, A. Ohsawa, and N. Toyokura, Silicon surface roughness—structural observation by reflection electron microscopy, Appl. Phys. Lett. 48, 779, 1986. [Pg.492]

RAIS Reflection-Absorption Infrared Spectroscopy, 33 RBS Rutherford Backscattering Spectrometry, 36 REELS Reflection Electron Energy Loss Spectroscopy, 18, 34 REM Reflection Electron Microscopy ... [Pg.596]

Figure 13.22. Reflection electron microscopy (REM) is an old technique that was revived in the 1980s but is still not widely used. The sample is essentially bulk material with just one surface viewed. The electrons are diffracted off the surface as in RHEED (the diffraction pattern looks just like any other RHEED pattern), and are then imaged by the TEM in the usual way. The resolution is about 0.7 nm and chemical analysis can be considered as shown by the AEGai (As/GaAs superiattice in this image square millimeters of surface can be viewed just by scanning the sample. Notice the foreshortening. Figure 13.22. Reflection electron microscopy (REM) is an old technique that was revived in the 1980s but is still not widely used. The sample is essentially bulk material with just one surface viewed. The electrons are diffracted off the surface as in RHEED (the diffraction pattern looks just like any other RHEED pattern), and are then imaged by the TEM in the usual way. The resolution is about 0.7 nm and chemical analysis can be considered as shown by the AEGai (As/GaAs superiattice in this image square millimeters of surface can be viewed just by scanning the sample. Notice the foreshortening.
Reflection electron microscopy (REM) is used to observe denuded zones created at the terrace edges. By analyzing the denuded zones as a funetion of temperature and time, the diffusivity may be calculated. This technique is limited to studying surfaees where islands may be easily distinguished, as on the Si(lOO) surface where the 2x1 and 1x2 reconstructions that alternate in successive layers are clearly visible [95Doil]. The resolution of the technique is on the order of 0.5 pm... [Pg.459]

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See also in sourсe #XX -- [ Pg.359 ]

See also in sourсe #XX -- [ Pg.83 ]

See also in sourсe #XX -- [ Pg.239 , Pg.240 ]

See also in sourсe #XX -- [ Pg.239 , Pg.240 ]



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