Photoelectron diffraction scanned energy

Figure 1.1. Schematic diagram showing the electron elastic scattering pathways contributing to the techniques of low energy electron diffraction (LEED), backscattering photoelectron diffraction (including the scanned-energy mode - PhD) and surface extended X-ray absorption fine structure (SEXAFS). Black disks represent substrate atoms, grey-shaded disks represent adsorbate atoms.

Terry, J., Linford, M. R., Wigren, C., Cao, R. Y., Pianetta, P. and Chidsey, . E. D. Determination of the bonding of alkyl monolayers to the Si(lll) surface using chemical-shift, scanned-energy photoelectron diffraction. Applied Physics Letters 71, 1056 (1997). 

Electrons Auger Electron Spectroscopy, Extended X-Ray Absorption Fine Structure, Low-Energy Electron Diffraction, Scanning Electron Microscopy, Surface Extended X-Ray Absorption Fine Structure, Ultraviolet Photoelectron Spectroscopy, X-Ray Absorption Near Edge Fine Structure, and X-Ray Photon Spectroscopy. 

Some of the techniques described in this chapter used most widely today are Auger electron spectroscopy, X-ray photoelectron spectroscopy, electron-probe micro-analysis, low energy electron diffraction, scanning electron microscope, ion scattering spectroscopy, and secondary ion mass spectroscopy. The solid surface, after liberation of electrons, can be analyzed directly by AES, XPS, ISS, and EPMA (nondestructive techniques), or by liberation of ions from surfaces using SIMS (involving the destruction of the surface). Apart from the surface techniques, reflectance-absorbance infrared (RAIR) spectroscopy has also been employed for film characterization (Lindsay et al., 1993 Yin et al., 1993). Some... 

In developing and ophmizing new ES materials and components (electrode materials, electrolytes, and current collectors) based on their structures, morphologies, and performance, physical characterization using sophisticated instrument methods serves as the necessary approach. These instrumental methods are scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), energy-dispersive X-ray spectroscopy (EDX), X-ray photoelectron spectroscopy (XPS), Raman spectroscopy (RS), Fourier transform infrared spectroscopy (FTIR), and the Brunauer-Emmett-Teller (BET) technique. 

Jackson DC, Duncan DA, Unterberger W, Lerotholi TJ, Lorenzo DK, Bradley MK, Woodruff DP. Structure of cytosine on Cu(llO) a scanned-energy mode photoelectron diffraction study. J Phys Chem C 2010 114 15454-15463. 

In addition to experiments at the FHI in surface vibrational spectroscopy, with Brian Hayden and Horst Conrad, and in low temperature STM with Erhard Schweizer, Beat Briner and Hans-Peter Rust, Bradshaw embarked upon three lines of research that specifically took advantage of the availability of synchrotron radiation sources. The first, a long-running application of energy scan photoelectron diffraction to the study of adsorbed molecules and molecular fragments in collaboration with Phillip Woodruff of the University of Warwick, made extensive use of the BESSY facilities and earned Bradshaw and Woodruff the Max Planck Research Prize in 1994. Although photoelectron diffraction had... 

Film-forming chemical reactions and the chemical composition of the film formed on lithium in nonaqueous aprotic liquid electrolytes are reviewed by Dominey [7], SEI formation on carbon and graphite anodes in liquid electrolytes has been reviewed by Dahn et al. [8], In addition to the evolution of new systems, new techniques have recently been adapted to the study of the electrode surface and the chemical and physical properties of the SEI. The most important of these are X-ray photoelectron spectroscopy (XPS), SEM, X-ray diffraction (XRD), Raman spectroscopy, scanning tunneling microscopy (STM), energy-dispersive X-ray spectroscopy (EDS), FTIR, NMR, EPR, calorimetry, DSC, TGA, use of quartz-crystal microbalance (QCMB) and atomic force microscopy (AFM). 

The films were characterized using x-ray powder diffraction (XRD), x-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The photoelectron spectroscopy utilized a Vacuum Generators ESCA Lab II system with Mg(Ka) radiation. Binding energies (BE) were measured with respect to the surface C(ls) peak (284.5 eV) which was always present In these films. Scanning electron microscopy was done with a JEOL JSM-35C system. 

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