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Normal photoelectron diffraction

Normal photoelectron diffraction (38, 39) Rutherford back-scattering (2, 3, 118, 119)... [Pg.25]

Neutr. diffr. NEXAFS NPD Neutron Diffraction Near-Edge X-ray Absorption Eine Structure Normal Photoelectron Diffraction ... [Pg.68]

Figure 8 Photoelectron diffraction data (normal emission) for the surface formate species on (a) Cu 100] and (b) Cu 110). Insets A) The aligned atop site and B) the aligned bridge site. After [51. Figure 8 Photoelectron diffraction data (normal emission) for the surface formate species on (a) Cu 100] and (b) Cu 110). Insets A) The aligned atop site and B) the aligned bridge site. After [51.
All of these electron scattering techniques are typically capable of determining interatomic distances to a precision of 0.02-0.05 A, with specific cases in which somewhat worse, and occasionally even better, values are cited. For LEED and photoelectron diffraction one commonly finds the best precision for distances corresponding to atomic separations that are near-normal to the surface, with lower precision in locations parallel to the surface, a consequence of the fact that the scattered electrons are generally not detected at very grazing angles relative to the surface. [Pg.6]

In photoelectron diffraction experiments monoenergetic photons excite electrons from a particular atomic core level. Angular momentum is conserved, so the emitted electron wave-function is a spherical wave centered on the source atom, with angular momentum components / 1, where / is the angular momentum of the core level. If the incident photon beam is polarized, the orientation of the emitted electron wave-function can be controlled. These electrons then propagate through the surface and are detected and analyzed as in LEED experiments. A synchrotron x-ray source normally produces the intense beams of variable energy polarized photons needed for photoelectron diffraction. [Pg.28]

The interaction between the molecule and the d-electrons of the substrate system is more obvious in the case of NO interaction with NiO. The molecule is tilted with respect to the surface normal as is experimentally evident from X-ray absorption measurements [59] as well as photoelectron diffraction investigations... [Pg.337]

Other techniques such as low-energy electron diffraction (LEED) are also used for surface analysis, primarily for large single crystals. Single crystal metal surfaces have been used to study hydrocarbon catalysis on platinum (Anderson 1975). Techniques such as x-ray photoelectron spectroscopy (XPS) are also used for surface analysis but normally the reports describe mostly idealized single-crystal surfaces in high vacuum as opposed to using real-life (practical) catalyst systems under reaction environments. [Pg.78]

A consistent description of the structure of alkanethiol monolayers on gold has emerged from an array of spectroscopic and diffraction studies. X-ray photoelectron spectroscopic (XPS) studies support the presence of anisotropically chemisorbed alkanethiolates on gold [24-29]. Ellipsometric measurements [24-27, 30], capacitance studies [30] and XPS measurements [31] confirm monolayer film thickness. Fourier transform infrared external reflective spectroscopy (FTIR-ERS) shows that the chains tilt at about 30° off the surface normal, and the plane containing the carbon backbone is twisted out of the plane of tilt by about 50° [25-27, 30, 32, 33]. [Pg.2920]

Although the tubular geometry is normally preferred in the chemical industry, both tubular and fiat plate geometries have been used for making composite Pd and Pd/alloy membranes. Methods used for the membrane characterization include, among others, macroscopic permeation flux measurements and microscopic surface and microstructure analysis by various techniques such as X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), X-ray Photoelectron Spectroscopy (XPS) and Atomic Force Microscopy (AFM). [Pg.246]

Optical microscopy (OM), polarized light microscopy (PLM), phase contrast microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and scanning transmission electron microscopy (STEM) are the methods normally used for identification and quantification of the trace amounts of asbestos fibers that are encountered in the environment and lung tissue. Energy-dispersive X-ray spectrometry (EDXS) is used in both SEM and TEM for chemical analysis of individual particles, while selected-area electron diffraction (SAED) pattern analysis in TEM can provide details of the cell unit of individual particles of mass down to 10 g. It helps to differentiate between antigorite and chrysotile. Secondary ion mass spectrometry, laser microprobe mass spectrometry (EMMS), electron probe X-ray microanalysis (EPXMA), and X-ray photoelectron spectroscopy (XPS) are also analytical techniques used for asbestos chemical characterization. [Pg.151]


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Diffraction photoelectron

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