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Electron diffraction low-energy

Another mode of electron diffraction, low energy electron diffraction or FEED [13], uses incident beams of electrons with energies below about 100 eV, with corresponding wavelengths of the order of 1 A. Because of the very strong interactions between the incident electrons and tlie atoms in tlie crystal, there is very little penetration of the electron waves into the crystal, so that the diffraction pattern is detemiined entirely by the... [Pg.1367]

Diffraction Low energy electron diffraction LEED Electron Electron... [Pg.2]

The diffraction pattern consists of a small number of spots whose symmetry of arrangement is that of the surface grid of atoms (see Fig. IV-10). The pattern is due primarily to the first layer of atoms because of the small penetrating power of the low-energy electrons (or, in HEED, because of the grazing angle of incidence used) there may, however, be weak indications of scattering from a second or third layer. [Pg.303]

LEED Low-energy electron diffraction [62, 75, 105] Elastic backscattering of electrons (10-200 eV) Surface structure... [Pg.313]

The technique of low-energy electron diffraction, LEED (Section VIII-2D), has provided a considerable amount of information about the manner in which a chemisorbed layer rearranges itself. Somotjai [13] has summarized LEED results for a number of systems. Some examples are collected in Fig. XVlII-1. Figure XVIII-la shows how N atoms are arranged on a Fe(KX)) surface [14] (relevant to ammonia synthesis) even H atoms may be located, as in Fig. XVIII-Ih [15]. Figure XVIII-Ic illustrates how the structure of the adsorbed layer, or adlayer, can vary wiA exposure [16].f There may be a series of structures, as with NO on Ru(lOTO) [17] and HCl on Cu(llO) [18]. Surface structures of... [Pg.686]

We will, in the latter part of this discussion, focus only on those few methods that have been the most productive, with low-energy electron diffraction (FEED) receiving the most attention. Indeed, LEED has been the most successfiil surface stmctiiral method in two quite distinct ways. First, LEED has become an almost universal characterization... [Pg.1751]

The diffraction of low-energy electrons (and any other particles, like x-rays and neutrons) is governed by the translational syimnetry of the surface, i.e. the surface lattice. In particular, the directions of emergence of the diffracted beams are detemiined by conservation of the linear momentum parallel to the surface, bk,. Here k... [Pg.1767]

Pendry J B 1974 Low-Energy Electron Diffraction (London Academic)... [Pg.1777]

Rous P J 1993 A global approach to the search problem in surface crystallography by low-energy electron diffraction Surf. Sc 296 358-73... [Pg.1777]

HEED = high energy electron diffraction IILE = ion-induced light emission INS = ion-neutralization spectroscopy IRS = infrared spectroscopy ISS = ion-scattering spectroscopy LEED = low energy electron diffraction LEIS = low energy ion scattering ... [Pg.398]

Low-Energy Electron Diffraction, LEED 252 Reflection High-Energy Electron Diffraction, RHEED 264... [Pg.193]

This chapter contains articles on six techniques that provide structural information on surfaces, interfeces, and thin films. They use X rays (X-ray diffraction, XRD, and Extended X-ray Absorption Fine-Structure, EXAFS), electrons (Low-Energy Electron Diffraction, LEED, and Reflection High-Energy Electron Diffraction, RHEED), or X rays in and electrons out (Surfece Extended X-ray Absorption Fine Structure, SEXAFS, and X-ray Photoelectron Diffraction, XPD). In their usual form, XRD and EXAFS are bulk methods, since X rays probe many microns deep, whereas the other techniques are surfece sensitive. There are, however, ways to make XRD and EXAFS much more surfece sensitive. For EXAFS this converts the technique into SEXAFS, which can have submonolayer sensitivity. [Pg.193]

Alternatives to XRD include transmission electron microscopy (TEM) and diffraction, Low-Energy and Reflection High-Energy Electron Diffraction (LEED and RHEED), extended X-ray Absorption Fine Structure (EXAFS), and neutron diffraction. LEED and RHEED are limited to surfaces and do not probe the bulk of thin films. The elemental sensitivity in neutron diffraction is quite different from XRD, but neutron sources are much weaker than X-ray sources. Neutrons are, however, sensitive to magnetic moments. If adequately large specimens are available, neutron diffraction is a good alternative for low-Z materials and for materials where the magnetic structure is of interest. [Pg.199]

Surface-sensitive diffraction is, for the most part, restricted to analysis of surfaces of single crystals and overlayers and films on such surfaces. If a polycrystalline sample is illuminated using a beam of low-energy electrons, each crystallite surfiice exposed will create its own diffraction pattern, all of which will be superimposed on the fluorescent screen detector. If more than a few orientations are illuminated by the beam, the pattern becomes too complicated to analyze. Flowever, if the size of the... [Pg.261]

G. Ertl and J. Kiippers. Low-Energy Electrons and Surface Chemistry. Verlag Chemie, Weinheim, 1974, Chps. 9 and 10. An introductory treatment of diffraction. [Pg.263]


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See also in sourсe #XX -- [ Pg.302 , Pg.303 , Pg.304 , Pg.313 ]




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Diffuse low energy electron diffraction

Electron diffraction

Electronic diffraction

Electrons diffracted

Energy diffraction

Ex situ low-energy electron diffraction

Inelastic low-energy electron diffraction

LEED—See Low energy electron diffraction

Low Energy Electron Diffraction LEED)

Low energy

Low energy electron

Low energy electron diffraction patterns

Low energy electron diffraction. See

Low-energy electron diffraction LEED) patterns

Low-energy electron diffraction intensities

Low-energy electron diffraction methods

Low-energy electron diffraction surface

Low-energy electron diffraction-Auger

Spectroscopy low energy electron diffraction

Spot profile analysis low energy electron diffraction

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