Dielectric comparison with other techniques

Dielectric Spectroscopy in Comparison with Other Techniques... 

This book describes the applications of important new NMR spectroscopic methods to a variety of useful materials and compares them with results from other techniques such as adsorption, differential scanning calorimetry, thermally stimulated depolarization cmrent, dielectric relaxation spectroscopy, infrared spectroscopy, optical microscopy, and small-angle and wide-angle x-ray scattering. The text explores the application of NMR spectroscopy to examine interfacial phenomena in objects of increasing complexity, beginning with immodified and modified silica materials. It then describes properties of various mixed oxides with comparisons to individual oxides and also describes carbon materials such as graphite and carbon nanotubes. 

The moments of a charge distribution provide a concise summary of the nature of that distribution. They are suitable for quantitative comparison of experimental charge densities with theoretical results. As many of the moments can be obtained by spectroscopic and dielectric methods, the comparison between techniques can serve as a calibration of experimental and theoretical charge densities. Conversely, since the full charge density is not accessible by the other experimental methods, the comparison provides an interpretation of the results of the complementary physical techniques. The electrostatic moments are of practical importance, as they occur in the expressions for intermolecular interactions and the lattice energies of crystals. 

A simple nondestructive capacitance method is proposed (Adamyan et al, 2006) for the determination of basic PSi parameters such as layer thickness, porosity and dielectric permittivity. The method is based on two comparative measurements of the capacitance of the metal/PSi/single crystalline silicon/metal structure one measurement is taken when there are air-filled pores, while the other measurement involves pores filled by an organic compound with a high value of dielectric permittivity. Comparison of results obtained in Adamyan et al. (2006) by the ball lap and the gravimetric techniques before and after anodization, with the data of capacitance measurements carried out with the same samples prior to their destruction, shows sufficiently good agreement. 

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