Diamonds scanning electron microscopy

A.H. Deutchman and R.J. Partyka (Beam Alloy Corporation observe, "Characterization and classification of thin diamond films depend both on advanced surface-analysis techniques capable of analyzing elemental composition and microstructure (morphology and crystallinity), and on measurement of macroscopic mechanical, electrical, optical and thermal properties. Because diamond films are very thin (I to 2 micrometers or less) and grain and crystal sizes are very small, scanning electron microscopy... 

All samples were analyzed by means of X-ray diffraction and elemental analysis. Additionally, the cobalt distribution throughout the samples was studied by means of scanning electron microscopy in combination with electron microprobe analysis. Prior to the measurements, the samples were imbedded in resin, cut and subsequently polished with diamond paper. 

Field emission scanning electron microscopy (FESEM), glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy (TEM), micro Raman scattering, Fourier transform inftaied (FTIR) spectrometry, Rutherford back scattering (RBS) studies and electron probe micro analysis (EPMA) have been carried out to obtain micro-structural and compositional properties of the diamond/p-SiC nanocomposite films. Atomic force microscopy (AFM) and indentation studies have been carried out to obtain film properties on the tribological and mechanical front. 

Scanning electron microscopy revealed the formation of debris around the indentation contact area in diamond [196] (Fig. 41a). This correlates with the behavior of silicon and germanium under contact loading, where the formation of plastic extrusions around indentations is believed to be indicative of the pressure-induced metallization (see Section 2.4). The formation of ductile extrusions was reported along the edges of the Vickers impression in diamond and around the deformed top of the diamond indenter [196] (Fig. 41), suggesting that similar transformations occurred in both the indenter and the crystal. 

The interaction of artificial diamond single crystals with a high pressure water fluid at 900 and 1400°C under 5.2 GPa yielded nondiamond carbon films [42]. Scanning electron microscopy (SEM) examinations revealed the formation of deep and shallow flat-bottomed trigons on diamond-(l 11) faces at reaction temperatures above 1000°C. 

The octahedral pressure cells containing the samples were recovered from the multi-anvil experiment and either broken or cut in half, using a diamond wiresaw. In the latter case, the j -sialon samples were also halved in the axial direction. The specimens were then characterized with optical and scanning electron microscopy (SEM), transmission electron microscopy (TEM), electron probe microanalysis (EPMA), powder X-ray diffractometry (XRD), and microhardness testing using the Vickers method. 

Highly boron-doped diamond films, which have been widely studied in electrochemistry, can be grown by chemical vapor deposition (CVD) and are electrically conductive. Different electrochemical properties of boron-doped diamond films have been studied, such as reactivity [133] and electronic structure [134]. Different characterization techniques have been used to study the electrochemistry of diamond, such as scanning electron microscopy [123, 135] and Raman spectroscopy [125,136]. 

The names for these two film types arise from their nominal crystallite size and morphology. Figure 5 shows scanning electron microscopy (SEM) images of the two types of boron-doped diamond thin film deposited on Si. High quality microcrystalline diamond films are deposited from CH4/H2 source gas mixtures with volumetric ratios of 0.3 to 1.0%,... 

Figure 20 Raman spectra obtained from a-Geo.o4Co96 films annealed at several temperatures. The solid line is the fitted spectrum, as discussed in the text. The D and G bands are also plotted (dashed lines) [57]. (Reprodueed from Diamond and Related Materials, 8, Mariotto, G., et al., Raman spectroscopy and scanning electron microscopy investigation of annealed amorphous carbon germanium films deposited by d.c. magnetron scattering, pp. 668-672. Copyright 1999, with permission from Elsevier Science.)...

The morphology of the films was characterized by scanning electron microscopy (SEM) with a JEOL JSM 5400 microscope. The surface morphology produced under the conditions used in this research consists in general of a highly faceted, polycrystalline film and uniformly deposited 5-pm diameter diamond crystallites can be obtained with good reproducibility from film to film. Fig. 2.3 shows a typical SEM image of a CVD boron-doped diamond film deposited in this way. 

Successfully fabricated diamond fibers were characterized by use of scanning electron microscopy (SEM) and Raman spectroscopy, while the roughness factor of the diamond fiber was calculated based on double-layer capacitance measurements. SEM images of diamond fibers are shown in Figure 18.1. Figure 18.1a shows a suitable diamond fiber for microdisk electrode fiibrication, while... 

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