Deposit thickness calculation

Fig. 37. Copper RBS signal of A1 0.5 atom % Cu vapor-deposited films on quartz passivated galvano-statically with 1 mA cm 2 in 0.1 M citrate buffer pH 6.0 to increasing potentials including a film as deposited. Thickness calculated from complete RBS spectrum and applied charge [84].

The deposit on the bottom of the schlotting-pan gradually attains a thickness calculated to interfere very materially with the conducting power of the iron, and so occasions much loss of heat the pan has then to be scaled. Of course the necessity for performing this operation will vary considerably with the degree of purity of tho salt. It is usual, howeveT, to scale the pan after it has been filled up from eight to about fifteen times. 

Fig. 14.3. Calculated deposition thickness of a carbon layer on a beryllium substrate exposed to a 100 eV deuterium plasma containing a varying concentration of carbon impurities. From [12]...

When the post-anneal resistivities are corrected for this film thickness shrink they become independent of the as-deposited Si/W atomic ratio. In figure 9.5, the as-deposited thicknesses were used for as-deposited and after anneal films to calculate the resistivities. Thus the increase in post-anneal bulk resistivity at higher Si/W ratios observed here is due to the thickness shrink during anneal. 

It is the diameter open to flow which should be employed in Equation (10.25), or expressions linking flow rate and pressure drop, and this is not always easy to assess. The deposit builds up on the tube wall, as illustrated in Figure 10.20. So, for the purposes of predictive crossflow filtration modelling or simulation the deposit thickness must be known before the shear stress and hence fiux rate can be calculated. This can be achieved by combining Equation (10.23) with the various flow equations as follows. 

By nominal thickness is meant the thickness calculated from the time of deposition of a calibrated atom stream, neglecting all subsequent aggregation, and supposing the deposit to be uniform. 

More precisely, the average deposited thickness is measured at short times using ellipsometry, before "phase separation," and then the ratio of the areas covered by each film at late times allows calculating their thickness, if mass conservation is assumed. The calculated values agree with the values of the UB and LB provided by ellipsometric profiles of microdroplets. Precise thickness measure-... 

A CCD camera perpendicular to the support plan captures the position of this intersection line (Figure 11.3). Knowing A and 0 enables the deposit thickness, e, to be calculated thanks to the following relationship ... 

In this expression, Vj. is the ultrasonic longitudinal velocity in the layer, is the layer thicJcness and At is the time of flight between the two echoes. This time of flight is usually calculated with an intercorrelation method or using the FFT phase slope. The measurement of the time of flight allows the deposit thickness to be calculated. 

Table II. Comparison of modulation wavelengths calculated from Faraday s law (Ap) and from x-ray satellite spacings (A ) for ceramic superlattices deposited at various current densities (J) and dwell times (t). X represents the individual layer thickness calculated from Faraday s law. The electrode area ranged from 0.78 to 1.96 cm. ...

We are now in a position to calculate the reflections from multiple mterfaces using the simple example of a thin film of material of thickness d with refractive index n.2 sandwiched between a material of refractive index (where this is generally air witii n = ) deposited onto a substrate of refractive index [35, 36], This is depicted in figure Bl.26.9. The resulting reflectivities for p- and s-polarized light respectively are given by ... 

Fig. 4.10. Fluorescence signal from small particles or thin films deposited on a silicon substrate used as sample carrier. The intensity was calculated for particles, thin films, or sections ofdiffe-rent thickness but equal mass of analyte, and plotted against the glancing angle f. A Mo-Ka beam was assumed for excitation. Particles or films more than 100 nm thick show double intensity below the critical angle of0.1° [4.21].

The Nomograph Part 3 (Figure I0-43C) may be used in a number of ways. For example, what will the fouling resistance, R(, be after an arbitrarily chosen time, t, or it can calculate the thickness of a fouling deposit after an arbitrarily chosen time t, providing the thermal conductivity of the deposited material is known. It can calculate thermal conductivity of a deposit, providing thickness is known, or estimated. 

Figure 13-5 is the box model of the remote marine sulfur cycle that results from these assumptions. Many different data sets are displayed (and compared) as follows. Each box shows a measured concentration and an estimated residence time for a particular species. Fluxes adjoining a box are calculated from these two pieces of information using the simple formula, S-M/x. The flux of DMS out of the ocean surface and of nss-SOl back to the ocean surface are also quantities estimated from measurements. These are converted from surface to volume fluxes (i.e., from /ig S/(m h) to ng S/(m h)) by assuming the effective scale height of the atmosphere is 2.5 km (which corresponds to a reasonable thickness of the marine planetary boundary layer, within which most precipitation and sulfur cycling should take place). Finally, other data are used to estimate the factors for partitioning oxidized DMS between the MSA and SO2 boxes, for SO2 between dry deposition and oxidation to sulfate, and for nss-SO4 between wet and dry deposition. 

The technique used to study dewetting dynamics on materials consists of making a flat, smooth elastomer surface. A hquid puddle is deposited within a 50-mm-diameter ring of 0.1-mm-thick plasticized adhesive paper adhering to the substrate. The adhesive paper acts as a spacer. A microscope slide is drawn over the liquid to obtain a liquid film of ca. 0.1-mm thickness. At this thickness, the liquid film is unstable, being much less than the equilibrium value, of ca. 1.5 mm calculated from Eq. (29). Nucleation of dry patches... 

Experiments of propane pyrolysis were carried out using a thin tubular CVD reactor as shown in Fig. 1 [4]. The inner diameter and heating length of the tube were 4.8 mm and 30 cm, respectively. Temperature was around 1000°C. Propane pressure was 0.1-6.7 kPa. Total pressure was 6.7 kPa. Helium was used as carrier gas. The product gas was analyzed by gas chromatography and the carbon deposition rate was calculated from the film thickness measured by electron microscopy. The effects of the residence time and the temperature... 

Figure 1 shows AES data for the oxidized titanium surface before and after deposition of 30 X of platinum with the substrate held at 130 K. The platinum thickness was calculated from the attenuation of the oxygen AES signal assuming layered growth of the metal. From the spectra It Is clear that the platinum was sufficient to completely attenuate the underlaying features of the titanium oxide. 

Fig. 3.23 Left-. Calculated relationship between the thickness of an alteration rind and/or dust coating on a rock and the amount of 15.0-keV radiation absorbed in the rind/coating for densities of 0.4, 2.4, and 4.0 g cm [57]. The bulk chemical composition of basaltic rock was used in the calculations, and the 15.0 keV energy is approximately the energy of the 14.4 keV y-ray used in the Mossbauer experiment. The stippled area between densities of 2.4 and 4.0 g cm is the region for dry bulk densities of terrestrial andesitic and basaltic rocks [58]. The stippled area between densities of 0.1 and 0.4 g cm approximates the range of densities possible for Martian dust. The density of 0.1 g cm is the density of basaltic dust deposited by air fall in laboratory experiments [59]. Right Measured spectra obtained on layered laboratory samples and the corresponding simulated spectra, from top to bottom 14.4 keV measured (m) 14.4 keV simulated (s) 6.4 keV measured (m) and 6.4 keV simulated (s). All measurements were performed at room temperature. Zero velocity is referenced with respect to metallic iron foil. Simulation was performed using a Monte Carlo-based program (see [56])...

Though the process of wind action and transport of material is clearly recognized, it is difficult to measure its impact in the accumulation zones. Such measurements are most successful in the immediate neighborhood of the deflation zones where the thickness and volume of sand or loess deposits can easily be calculated. In the northern periphery of the Negev, aeolian deposits range from a few cm to several meters, which corresponds to an average accumulation of 10 to 100 mm/millennium since the Lower Pleistocene. 

---